Comparison Effect of Spin Speeds and Substrate Layers on Properties of Doubly Doped tin Oxide thin Films Prepared by SOL-GEL Spin Coating Method

Tin oxide thin films doubly doped with antimony and fluorine (Sb, F) were deposited by sol-gel spin coating method at different spin speeds and substrate layers on glass substrate. Effect of spin speeds and substrate layers on the characterizations of the films was investigated. X-ray diffraction studies revealed that antimony and fluorine have been successfully doped into the SnO2 thin films and all the prepared films were single crystalline in nature and exhibited orthorhombic structure with preferential orientation {021} family of planes. As the tin oxide thin films have quite often structure of tetragonal polycrystalline, this obtained orthorhombic structure is rarely in terms of literature. Although intensity of preferential orientation changed, its orientation did not change with increasing spin speeds and substrate layers. Also, peak intensity of the films prepared with 6 substrate layers was bigger than 5 substrate layers, but crystallinity in 5 substrate layers was better than 6 substrate layers. Transmittance (90-95%.) values found in this study were to be much better than previously reported values (50-80%). Together with these studies, PLQY value of an inorganic material such as tin oxide which weakly emit was measured. Eventually, the obtained results revealed that properties of the thin films were greatly affected by spin speeds and substrate layers