Raman depth-profiling characterization of a migrant diffusion in a polymer

J. Membr. Sci. ISI Document Delivery No.: 776XU Times Cited: 0 Cited Reference Count: 19 Mauricio-Iglesias, M. Guillard, V. Gontard, N. Peyron, S. Commission of the European Communities Authors would like to kindly acknowledge financial support from the Commission of the European Communities, Framework 6, Priority 5 'Food Quality and Safety', Integrated Project NovelQ FP6-CT-2006-015710. Elsevier science bv AmsterdamInternational audienceRaman depth-profiling microspectroscopy provides rich information on chemical/physical characterization in a non-destructive mode with micrometric resolution. However, refraction causes distortions to the data obtained thereby. A method to determine the diffusivity of an additive in low linear density polyethylene (LLDPE) with Raman depth profiling is proposed, combining the latest developments on data treatment of refraction distorted profiles. The method is compared with the results obtained analysing the cross section of the sample, with a maximum 32% relative error between both methods. The main benefits, characteristics of this method, a discussion of the experimental errors, as well as perspectives for future work are highlighted