High resolution and isolated scanning probe microscopy (SPM) is in demand for continued development of energy storage and conversion systems involving chemical reactions at the nanoscale as well as an improved understanding of biological systems. Carbon nanotubes (CNTs) have large aspect ratios and, if leveraged properly, can be used to develop high resolution SPM probes. Isolation of SPM probes can be achieved by depositing a dielectric film and selectively etching at the apex of the probe. In this paper the fabrication of a high resolution and isolated SPM tip is demonstrated using electron beam induced etching of a dielectric film deposited onto an SPM tip with an attached CNT at the apex
[[abstract]]We have selectively grown carbon nanotubes on the probe tip of an atomic force microscop...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
We describe a method for the production of nanoelectrodes at the apex of atomic force microscopy (AF...
[[abstract]]This paper demonstrates the fabrication of a micro-cantilever equipped with a high aspec...
AbstractIn this study, a Scanning Probe Microscope(SPM) probe was developed to measure electric prop...
We report on a novel method to fabricate carbon nanotube (CNT) nanoelectronic devices on silicon nit...
We report on a novel method to fabricate carbon nanotube (CNT) nanoelectronic devices on silicon nit...
This thesis describes a fabrication process to grow a single carbon nanotube (CNT) based probe on an...
Carbon nanotubes are considered to be an ideal imaging tip for atomic force microscopy (AFM) applica...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
Evaluating the electrical nature of carbon nanotubes (CNTs) from a collection requires establishing ...
Reconstruction errors due to the finite shape of the tip remain the major limitation of scanning pro...
Reconstruction errors due to the finite shape of the tip remain the major limitation of scanning pro...
[[abstract]]We have selectively grown carbon nanotubes on the probe tip of an atomic force microscop...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
We describe a method for the production of nanoelectrodes at the apex of atomic force microscopy (AF...
[[abstract]]This paper demonstrates the fabrication of a micro-cantilever equipped with a high aspec...
AbstractIn this study, a Scanning Probe Microscope(SPM) probe was developed to measure electric prop...
We report on a novel method to fabricate carbon nanotube (CNT) nanoelectronic devices on silicon nit...
We report on a novel method to fabricate carbon nanotube (CNT) nanoelectronic devices on silicon nit...
This thesis describes a fabrication process to grow a single carbon nanotube (CNT) based probe on an...
Carbon nanotubes are considered to be an ideal imaging tip for atomic force microscopy (AFM) applica...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
Evaluating the electrical nature of carbon nanotubes (CNTs) from a collection requires establishing ...
Reconstruction errors due to the finite shape of the tip remain the major limitation of scanning pro...
Reconstruction errors due to the finite shape of the tip remain the major limitation of scanning pro...
[[abstract]]We have selectively grown carbon nanotubes on the probe tip of an atomic force microscop...
Focused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology app...
We describe a method for the production of nanoelectrodes at the apex of atomic force microscopy (AF...