Low-Cost Quick-Look Radiation Testing of Electronic Components for the Mars Observer Camera

The development of modern electronics has far outstripped the inventory of components for which radiation tolerance has been determined and published. New component characteristics require a more integrated approach to radiation tolerance in system design. The Mars Observer Camera performance requirements could not be met with a design restricted to components of established radiation hardness. A balanced approach that intimately involved radiation effects in the system design process was required. This included low-cost, quick turnaround testing of total ionizing dose and heavy ion induced single event phenomena of upset and latchup. The results were used to inform the system design, which had to adapt to real component susceptibilities. Test results directly affected component selection, radiation shielding, and the data path and software architectures