Scrubbing is generally used in conjunction with triple modular redundancy (TMR) to increase the reliability of FPGA systems in space borne applications. We present in this paper a scrubber solution labeled Femto, currently being developed at Micro-RDC. Femto is a RISC, 8-bit, 9-instruction microcontroller specifically designed for scrubbing memories. The self-scrubber based on Femto occupies \u3c 600 slices and operates at 100 MHz. It has the capacity to calculate a CRC codebook of up to 1024 words on the fly and to use it to detect errors. Femto can be configured to perform blind scrubbing or readback-detect-correct type of operations. It also supports frame-based scrubbing, which allows a user to develop custom scrubbing techniques that b...
This study establishes the optimal Single Event Upset (SEU) mitigation strategy for Xilinx's 7-Serie...
This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on...
We describe and analyze a non-volatile configuration memory system with high resistance to radiation...
SRAM-based FPGAs are sensitive to radiation effects. Soft errors can appear and accumulate, potentia...
Scrubbing is a process in which a memory is systematically read, checked for errors, and corrected w...
As one of the most important components in the embedded systems, the SRAM are sensitive to radiation...
\u3cp\u3eSRAM-based FPGAs are widely used in many critical systems in which dependability is an esse...
SRAM-based FPGAs are widely used in many critical systems in which dependability is an essential fac...
Manufacturers of CubeSats prefer the use of COTS electronic components such as microcontrollers (MCU...
Advanced memories are designed using smaller geometries and lower voltages. This enables larger leve...
Space processing applications deployed on SRAM-based Field Programmable Gate Arrays (FPGAs) are vuln...
The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly li...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
The usage of static random access memory-based field programmable gate arrays (FPGAs) on high-energy...
Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology...
This study establishes the optimal Single Event Upset (SEU) mitigation strategy for Xilinx's 7-Serie...
This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on...
We describe and analyze a non-volatile configuration memory system with high resistance to radiation...
SRAM-based FPGAs are sensitive to radiation effects. Soft errors can appear and accumulate, potentia...
Scrubbing is a process in which a memory is systematically read, checked for errors, and corrected w...
As one of the most important components in the embedded systems, the SRAM are sensitive to radiation...
\u3cp\u3eSRAM-based FPGAs are widely used in many critical systems in which dependability is an esse...
SRAM-based FPGAs are widely used in many critical systems in which dependability is an essential fac...
Manufacturers of CubeSats prefer the use of COTS electronic components such as microcontrollers (MCU...
Advanced memories are designed using smaller geometries and lower voltages. This enables larger leve...
Space processing applications deployed on SRAM-based Field Programmable Gate Arrays (FPGAs) are vuln...
The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly li...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
The usage of static random access memory-based field programmable gate arrays (FPGAs) on high-energy...
Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology...
This study establishes the optimal Single Event Upset (SEU) mitigation strategy for Xilinx's 7-Serie...
This paper presents an area-driven Field-Programmable Gate Array (FPGA) scrubbing technique based on...
We describe and analyze a non-volatile configuration memory system with high resistance to radiation...