Measurement of L-i X-ray fluorescence production cross sections and intensity ratios of some elements at 59.54 keV

Durak, Ridvan/0000-0002-3935-176X; DURAK, RIDVAN/0000-0002-3935-176X; Akman, Ferdi/0000-0002-8838-1762WOS: 000362459300008The L-i (i = l, alpha, beta, gamma) X-ray production cross section and L-alpha/L-l, L-alpha/L-beta, L-alpha/L-gamma, L-l/L beta, L-l/L-gamma, and L-beta/L-gamma intensity ratio values for Yb, Ta, W, Hg, Tl, Pb, Bi, Th, and U have been determined using an excitation geometry at 59.54 keV incident photon energy. The measurements were performed using an Am-241 annular radioactive source and a high resolution Si(Li) detector. The experimental results of L-i X-ray production cross sections and intensity ratios were compared with three different theoretical results and other available experimental results in the literature. Reasonable agreement is typically observed between the present and theoretical results