Open-Circuit faults of Submodules (SMs) are the most common fault type of modular multilevel converter (MMC). Thus, in order to improve the reliability of MMC, it is very important to detect and locate faulty MMC SMs. In this paper, a new fault diagnosis and location method based on high-order harmonic analysis of the bridge arm voltage is proposed, and the characteristics of SM open-circuit faults are analyzed. In the proposed method, faults are detected by comparing the amplitude of the bridge arm voltage at the switching frequency with a variable threshold, and the phase angle of the bridge arm voltage at the switching frequency is used to locate the faulty SM. The proposed method can detect faulty SM with just one voltage sensor per arm...
Copyright: © 2021 by the authors. Fault detection and classification are two of the challenging task...
This paper presents a fault detection and isolation (FDI) method for open-circuit faults of power se...
Copyright: © 2022 by the authors. Open circuit failure mode in insulated‐gate bipolar transistors (I...
Open-Circuit faults of Submodules (SMs) are the most common fault type of modular multilevel convert...
Reliability is one of the critical issues for a modular multilevel converter (MMC) since it consists...
This paper presents a new fault detection technique for the diagnosis and localization of sub-module...
The modular multilevel converter (MMC) is attractive for medium- or high-power applications because ...
Modular multilevel converters (MMCs) have a complex structure and a large number of submodules (SMs)...
A single fault detection and location for Modular Multilevel Converter (MMC) is of great significanc...
This letter presents a fault detection method for modular multilevel converters (MMC) which is capab...
This paper presents a fault-tolerant configuration for the modular multilevel converter (MMC). The p...
Due to the possibility of putting a large number of modules consisting of switches and capacitors co...
This letter presents a fault detection method for modular multilevel converters (MMC) which is capab...
The Modular Multilevel Converter is gaining wide acceptance in both industrial and research communit...
Currently, with the power electronics evolution, a major research axis is oriented towards the diagn...
Copyright: © 2021 by the authors. Fault detection and classification are two of the challenging task...
This paper presents a fault detection and isolation (FDI) method for open-circuit faults of power se...
Copyright: © 2022 by the authors. Open circuit failure mode in insulated‐gate bipolar transistors (I...
Open-Circuit faults of Submodules (SMs) are the most common fault type of modular multilevel convert...
Reliability is one of the critical issues for a modular multilevel converter (MMC) since it consists...
This paper presents a new fault detection technique for the diagnosis and localization of sub-module...
The modular multilevel converter (MMC) is attractive for medium- or high-power applications because ...
Modular multilevel converters (MMCs) have a complex structure and a large number of submodules (SMs)...
A single fault detection and location for Modular Multilevel Converter (MMC) is of great significanc...
This letter presents a fault detection method for modular multilevel converters (MMC) which is capab...
This paper presents a fault-tolerant configuration for the modular multilevel converter (MMC). The p...
Due to the possibility of putting a large number of modules consisting of switches and capacitors co...
This letter presents a fault detection method for modular multilevel converters (MMC) which is capab...
The Modular Multilevel Converter is gaining wide acceptance in both industrial and research communit...
Currently, with the power electronics evolution, a major research axis is oriented towards the diagn...
Copyright: © 2021 by the authors. Fault detection and classification are two of the challenging task...
This paper presents a fault detection and isolation (FDI) method for open-circuit faults of power se...
Copyright: © 2022 by the authors. Open circuit failure mode in insulated‐gate bipolar transistors (I...