Add to ORKGThe substructural characteristics of Zn1-xMnxTe films deposited by closed space vacuum sublimation method under various condensation conditions are investigated. Sizes of the coherent scattering domain size, microdeformation degree, staking fault defects’ concentration in the condensates, the averaged dislocation density at the subgrain boundaries and in their bulk as well as the total dislocation concentration are determined by the physical broadening of the X-ray lines using the Cauchy and gauss approximations and the threefold function convolution method. The calculations are compared with data for undoped ZnTe. It is found out that the Mn-doping causes some degradation of structural characteristics of the condensates compared wit...
Nanostructured ZnO films are obtained by chemical bath deposition from zinc nitrate, hexamethylenet...
Uniform and transparent thin films of Zn1-xMnxO (0 = 0.035, Mn3O4 (tetragonal) is observed as the se...
The methods of proton induced X ray emission (μ PIXE) and energy dispersive X ray analysis (EDAX) a...
In this paper, we have investigated some structural properties, Raman spectra and photoluminescence ...
In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films de...
In this paper we have been researching the influence of the deposition time and substrate temperatur...
Lattice deformation and extended defects such as grain boundaries and dislocations affect the crystal...
In this work by energy dispersive analysis of X-rays, scanning electron microscopy and X-ray diffrac...
Polycrystalline Cd1 xZnxTe thick films with thicknesses of about 30 μm have been deposited on a Mo c...
We undertook a detailed investigation of the structural- and optical-properties of CdTe- and Cd1-xMn...
At present, the interest of specialists working in the field of material science to semimagnetic sol...
This paper reports results of studying of effect of zinc concentration on structural and optical pro...
A series of Mg1-xZnxO (x=0, 0.05, 0.10, and 0.15) thin films were grown by metal-organic chemical va...
A series of Mg1-xZnxO (x=0, 0.05, 0.10, and 0.15) thin films were grown by metal-organic chemical va...
We investigated the structural, substructural and electrical properties of ZnS/CdTe and ZnTe/CdTe he...
Nanostructured ZnO films are obtained by chemical bath deposition from zinc nitrate, hexamethylenet...
Uniform and transparent thin films of Zn1-xMnxO (0 = 0.035, Mn3O4 (tetragonal) is observed as the se...
The methods of proton induced X ray emission (μ PIXE) and energy dispersive X ray analysis (EDAX) a...
In this paper, we have investigated some structural properties, Raman spectra and photoluminescence ...
In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films de...
In this paper we have been researching the influence of the deposition time and substrate temperatur...
Lattice deformation and extended defects such as grain boundaries and dislocations affect the crystal...
In this work by energy dispersive analysis of X-rays, scanning electron microscopy and X-ray diffrac...
Polycrystalline Cd1 xZnxTe thick films with thicknesses of about 30 μm have been deposited on a Mo c...
We undertook a detailed investigation of the structural- and optical-properties of CdTe- and Cd1-xMn...
At present, the interest of specialists working in the field of material science to semimagnetic sol...
This paper reports results of studying of effect of zinc concentration on structural and optical pro...
A series of Mg1-xZnxO (x=0, 0.05, 0.10, and 0.15) thin films were grown by metal-organic chemical va...
A series of Mg1-xZnxO (x=0, 0.05, 0.10, and 0.15) thin films were grown by metal-organic chemical va...
We investigated the structural, substructural and electrical properties of ZnS/CdTe and ZnTe/CdTe he...
Nanostructured ZnO films are obtained by chemical bath deposition from zinc nitrate, hexamethylenet...
Uniform and transparent thin films of Zn1-xMnxO (0 = 0.035, Mn3O4 (tetragonal) is observed as the se...
The methods of proton induced X ray emission (μ PIXE) and energy dispersive X ray analysis (EDAX) a...