Raman analysis of Zn1-xMnxTe polycrystalline films

Климов, Олексій Володимирович
Климов, Алексей Владимирович
Klymov, Oleksii Volodymyrovych
Курбатов, Денис Ігорович
Курбатов, Денис Игоревич
Kurbatov, Denys Ihorovych
Опанасюк, Анатолій Сергійович
Опанасюк, Анатолий Сергеевич
Opanasiuk, Anatolii Serhiiovych
Косяк, Володимир Володимирович
Косяк, Владимир Владимирович
Kosiak, Volodymyr Volodymyrovych
Копач, В.
Копач, В.
Kopach, V.
Болотников, А.Е.
Болотников, А.Е.
Bolotnikov, А.Е.
Джеймс, Р.Б.
Джеймс, Р.Б.
James, R.B.
Фочук, П.М.
Фочук, П.М.
Fochuk, P.M.

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Publication date

January 2013

Publisher

Instytut Dermatologii Radoslaw Spiewak

Language

English

Abstract

In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33848This work performed under the state budget project №0113U000131 Ministry of Education and Science of Ukraine and with the...