Radioelectonic Apparatus Parametrical Reliability Predicting with Deterministic Parameter Drift Bilateral Limitation

Based on the mathematical tools of theory of runs of random processes it is developed the forecasting method of parametric reliability of electronic equipment (EE), which allows to predict the refusals with reasonable accuracy at stationary and quasi-stationary and quasi-determined processes of drift of deterministic parameters for bilateral restrictions. Parametric reliability characterizes the capacity of device to serve specifications and compliance with defined probabilistic parameters defining parameters of given value. Drifts of deterministic parameters are random processes that are different. In the case of quasi-stationary processes the EE reliability can be predicted using the method of quantile zones. Known methods for forecasting stationary or quasi-stationary processes to date are available. The obtaining method allows to predict parameters of runs of random drift process, namely their number, total duration and average duration of run. Simulations showed ability to predict emission parameters for different characters of drift random processes in the case of bilateral constraints