Commercial off-the-shelf microprocessors are the core of low-cost embedded systems due to their programmability and cost-effectiveness. Recent advances in electronic technologies have allowed remarkable improvements in their performance. However, they have also made microprocessors more susceptible to transient faults induced by radiation. These non-destructive events (soft errors), may cause a microprocessor to produce a wrong computation result or lose control of a system with catastrophic consequences. Therefore, soft error mitigation has become a compulsory requirement for an increasing number of applications, which operate from the space to the ground level. In this context, this paper uses the concept of selective hardening, which is ...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
Software-based fault tolerance techniques are a low-cost way to protect processors against soft erro...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Comunicación presentada en the 11th European Conference on Radiation and its Effects on Components a...
ARM processors are leaders in embedded systems, delivering high-performance computing, power efficie...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
This article analyzes diverse criteria for effectively implementing selective hardening against soft...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
This article presents a software protection technique against radiation-induced faults which is base...
Soft errors are one of the significant design technology challenges at smaller technology nodes and ...
This paper presents a metric for the efficient application of selective hardening using software-bas...
All-Programmable System-on-Chips (APSoCs) constitute a compelling option for employing applications ...
This paper presents a novel methodology for the HW/SW co-design of fault tolerant embedded systems t...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
Software-based fault tolerance techniques are a low-cost way to protect processors against soft erro...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Comunicación presentada en the 11th European Conference on Radiation and its Effects on Components a...
ARM processors are leaders in embedded systems, delivering high-performance computing, power efficie...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
This article analyzes diverse criteria for effectively implementing selective hardening against soft...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
This article presents a software protection technique against radiation-induced faults which is base...
Soft errors are one of the significant design technology challenges at smaller technology nodes and ...
This paper presents a metric for the efficient application of selective hardening using software-bas...
All-Programmable System-on-Chips (APSoCs) constitute a compelling option for employing applications ...
This paper presents a novel methodology for the HW/SW co-design of fault tolerant embedded systems t...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
Software-based fault tolerance techniques are a low-cost way to protect processors against soft erro...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...