The purpose of this thesis is to investigate the initial stages of the growth of heteroepitaxial films on Si substrates. Two prototype systems were chosen for this research: first is Ge/Si(001), where the two species have similar chemical properties; second is CaF2/Si(111), in which the ionic epitaxial film and substrate have similar crystal structures. Both are strained heteroepitaxial films because of their lattice mismatch. These systems have attracted much attention largely due to various promising applications in micro-electronics and fundamental interest in the basic studies of heteroepitaxy.;The Metropolis Monte Carlo method is used for this research. For Ge/Si, because of short range interaction forces between atoms, the CELL method...
We present a detailed study of some atomic-scale processes fundamental in understanding Si and Ge t...
A microscopic picture of heteroepitaxy on silicon is obtained using surface techniques uch as photoe...
The molecular dynamics method is used to determine minimum energy configurations of Si and Ge adatom...
The molecular dynamics method using an empirical potential energy function to describe the Sisingle ...
Epitaxial growth can occur layer-by layer or by islanding. The mode of growth depends on the surface...
The epitaxial growth of Ge on Si(OO1) is simulated by employing a hybrid approach based on molecular...
The initial stages of the growth of germanium on the dimer reconstructed Si(100) surface is modelled...
A numerical Monte Carlo (MC) model is described in detail to simulate epitaxial growth. This model a...
The purpose of this thesis is to study the effect of conditions such as substrate orientation, proce...
Strained epitaxial growth of Ge on Si(001) produces self-assembled, nanometer scale islands, or quan...
In this work we investigate the influence of the Si substrate orientation on the growth instability ...
Surface reconstruction, atomic charge transfer, step formation, atomic structure and defects on the ...
A promising route for growing atomically flat Si on Ge(100) is described. The key to this achievemen...
High-quality Ge substrates have numerous applications, including high-efficiency III-V multijunction...
High-quality Ge substrates have numerous applications, including high-efficiency III-V multijunction...
We present a detailed study of some atomic-scale processes fundamental in understanding Si and Ge t...
A microscopic picture of heteroepitaxy on silicon is obtained using surface techniques uch as photoe...
The molecular dynamics method is used to determine minimum energy configurations of Si and Ge adatom...
The molecular dynamics method using an empirical potential energy function to describe the Sisingle ...
Epitaxial growth can occur layer-by layer or by islanding. The mode of growth depends on the surface...
The epitaxial growth of Ge on Si(OO1) is simulated by employing a hybrid approach based on molecular...
The initial stages of the growth of germanium on the dimer reconstructed Si(100) surface is modelled...
A numerical Monte Carlo (MC) model is described in detail to simulate epitaxial growth. This model a...
The purpose of this thesis is to study the effect of conditions such as substrate orientation, proce...
Strained epitaxial growth of Ge on Si(001) produces self-assembled, nanometer scale islands, or quan...
In this work we investigate the influence of the Si substrate orientation on the growth instability ...
Surface reconstruction, atomic charge transfer, step formation, atomic structure and defects on the ...
A promising route for growing atomically flat Si on Ge(100) is described. The key to this achievemen...
High-quality Ge substrates have numerous applications, including high-efficiency III-V multijunction...
High-quality Ge substrates have numerous applications, including high-efficiency III-V multijunction...
We present a detailed study of some atomic-scale processes fundamental in understanding Si and Ge t...
A microscopic picture of heteroepitaxy on silicon is obtained using surface techniques uch as photoe...
The molecular dynamics method is used to determine minimum energy configurations of Si and Ge adatom...