This paper discusses the measurement accuracy of the loss tangent and the relative permittivity of low loss dielectrics. Typically used the "3 dB" method combined with the "Insertion Loss" computations has been compared with the more precise Transmission Mode QFactor Technique for measurements of tan of Rexolite, Polyethylene, LSAT, CaF₂, Teflon, YVO₄ and SLAO at room temperature. Also for teflon, rexolite and polyethylene we conducted the comparison for temperatures from 24K to 84K. For teflon (with tan below 6·10₋₆) errors up to 100% have been obtained; but for dielectric with tan above 5·10₋₅, errors were below 5%. For ∑(r) measurements, errors introduced by the thermal expansion coefficient have been analysed and found to be between 2.4...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
This work describes and evaluates a technique for determining dielectric properties, and presents r...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
This paper discusses the measurement accuracy of the loss tangent and the relative permittivity of l...
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880...
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880...
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880...
The dielectric resonator method is now widely accepted as a precise measurement method for determini...
Dielectric resonators are widely used in microwave circuits due to their small size, low loss and hi...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
copyright(c)1994 IEICE 許諾番号:07RB0174 http://www.ieice.org/jpn/trans_online/index.htmlThe dielectric...
Resonant techniques that allow achieving the highest sensitivity of the loss dielectric loss tangent...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
This work describes and evaluates a technique for determining dielectric properties, and presents r...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
This paper discusses the measurement accuracy of the loss tangent and the relative permittivity of l...
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880...
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880...
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880...
The dielectric resonator method is now widely accepted as a precise measurement method for determini...
Dielectric resonators are widely used in microwave circuits due to their small size, low loss and hi...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
copyright(c)1994 IEICE 許諾番号:07RB0174 http://www.ieice.org/jpn/trans_online/index.htmlThe dielectric...
Resonant techniques that allow achieving the highest sensitivity of the loss dielectric loss tangent...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
This work describes and evaluates a technique for determining dielectric properties, and presents r...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...