Semiconductor technology scaling has long been a source of dramatic gains in our computing capabilities. However, as we test the physical limits of silicon feature size, serious reliability and computational efficiency challenges confront us. The supply voltage levels have practically stagnated, resulting in increasing power densities and operating temperatures. Given that most semiconductor wearout mechanisms are highly dependent on these parameters, significantly higher failure rates are projected for future technology generations. Further, the rise in power density is also limiting the number of resources that can be kept active on chip simultaneously, motivating the need for energy-efficient computing. In this landscape of technologica...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
The saturation of single-thread performance, along with the advent of the power wall, has resulted i...
Semiconductor technology scaling has long been a source of dramatic gains in our computing capabilit...
The continued scaling of silicon fabrication technologies has enabled the integration of dozens of p...
Power and reliability issues are expected to increase in future multicore systems with a higher degr...
Recent trends in transistor technology have dictated the constant reduction of device size. One nega...
The adverse effects of technology scaling on reliability of digital circuits have made the use of fa...
Reconfigurable logic or Field-Programmable Gate Array (FPGA) devices have the ability to dynamically...
Today’s designs are being shaped by the challenges of nano-CMOS technologies: increased power densit...
The continuing advances in VLSI technology have fueled dramatic performance gains for general-purpo...
Part 2: Asian Conference on Availability, Reliability and Security (AsiaARES)International audienceF...
Year after year semiconductor manufacturing has been able to integrate more components in a single c...
In the last decades, the computing technology experienced tremendous developments. For instance, tra...
\ua9 2014 IEEE. Recent trends in semiconductor technology have dictated the constant reduction of de...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
The saturation of single-thread performance, along with the advent of the power wall, has resulted i...
Semiconductor technology scaling has long been a source of dramatic gains in our computing capabilit...
The continued scaling of silicon fabrication technologies has enabled the integration of dozens of p...
Power and reliability issues are expected to increase in future multicore systems with a higher degr...
Recent trends in transistor technology have dictated the constant reduction of device size. One nega...
The adverse effects of technology scaling on reliability of digital circuits have made the use of fa...
Reconfigurable logic or Field-Programmable Gate Array (FPGA) devices have the ability to dynamically...
Today’s designs are being shaped by the challenges of nano-CMOS technologies: increased power densit...
The continuing advances in VLSI technology have fueled dramatic performance gains for general-purpo...
Part 2: Asian Conference on Availability, Reliability and Security (AsiaARES)International audienceF...
Year after year semiconductor manufacturing has been able to integrate more components in a single c...
In the last decades, the computing technology experienced tremendous developments. For instance, tra...
\ua9 2014 IEEE. Recent trends in semiconductor technology have dictated the constant reduction of de...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
The saturation of single-thread performance, along with the advent of the power wall, has resulted i...