Error-Rate Estimation Combining SEE Static Cross-Section Predictions and Fault-Injections Performed on HDL-Based Designs

International audienceAn approach aiming at estimating the error ratesof integrated circuits, early in the design phase, is presented.It combines static SBU cross-sections predicted from MUSCASEP3 (Multi-Scales Single Event Phenomena Predictive Platform)and results of fault-injection performed at netlist level thanksto NETFI method (NETlist Fault Injection). This approach wasapplied to predict dynamic cross-sections for two different circuits:the 8051 microcontroller and Leon2 processor. The goodcorrelation between predictions and measures puts in evidence theefficiency of the proposed MUSCA SEP3/NETFI approach andtools