A system based on low coherence interferometry is presented which enables absolute distance measurement of several reflecting layers along a beam path to be performed. Transverse information is to be obtained by using a 2-D imaging array, rather than a beaming scanning device. The system may provide useful information about reflecting interface layers inside transparent objects at micron scale over a virtually unlimited range
This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding....
With an absolutely measuring interferometric distance sensor the three-dimensional shape of objects ...
Surface topography measurement for metal additive manufacturing (AM) is a challenging task for conta...
The ability to robustly measure a components physical dimensions is a critical part of a production ...
Low-coherence interferometry has been extended to the inspection of translucent industrial materials...
The investigation of transparent optical layers is a growing field of application of white-light int...
This thesis deals with low-coherence interferometry, laser interferometry and its combination intend...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
In this communication we introduce a low or reduced coherence interferometry technique that can be u...
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilom...
With the development of silicon micromachining technologies, non-contact measurement techniques for ...
A Novel setup for two-dimensional (2-D) parallel measurements of low-coherence heterodyne signal by ...
A dual beam low coherence interferometer with improved signal to noise ratio. The interferometer dir...
A low coherence speckle interferometer implemented using single mode optical fibre and a multimode l...
This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding....
With an absolutely measuring interferometric distance sensor the three-dimensional shape of objects ...
Surface topography measurement for metal additive manufacturing (AM) is a challenging task for conta...
The ability to robustly measure a components physical dimensions is a critical part of a production ...
Low-coherence interferometry has been extended to the inspection of translucent industrial materials...
The investigation of transparent optical layers is a growing field of application of white-light int...
This thesis deals with low-coherence interferometry, laser interferometry and its combination intend...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm...
In this communication we introduce a low or reduced coherence interferometry technique that can be u...
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilom...
With the development of silicon micromachining technologies, non-contact measurement techniques for ...
A Novel setup for two-dimensional (2-D) parallel measurements of low-coherence heterodyne signal by ...
A dual beam low coherence interferometer with improved signal to noise ratio. The interferometer dir...
A low coherence speckle interferometer implemented using single mode optical fibre and a multimode l...
This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding....
With an absolutely measuring interferometric distance sensor the three-dimensional shape of objects ...
Surface topography measurement for metal additive manufacturing (AM) is a challenging task for conta...
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