InAs/GaAs quantum-dot heterostructures grown by molecular-beam epitaxy are studied using cross-sectional scanning tunneling microscopy and spectroscopy. Individual InAs quantum dots (QDs) are resolved in the images. Tunneling spectra acquired 3-4 nm from the QDs show a peak located in the upper part of the GaAs bandgap originating from the lowest electron confined state, together with a tail extending out from the valence band from hole confined states. A line-shape analysis is used to deduce the binding energies of the electron and hole QD states.</p
Deep-level transient spectroscopy and photoluminescence studies have been carried out on structures ...
InAs quantum dots (QD's) grown by molecular-beam epitaxy on high-index GaAs(-3-1-5)B substrates were...
This thesis describes an experimental study of the electronic properties of semiconductor heterostru...
InAs/GaAs quantum dot (QD) heterostructures grown by molecular beam epitaxy are studied using cross-...
We present a cross-sectional scanning tunneling microscopy (X-STM) investigation of InAs quantum dot...
We have determined the size, shape, and composition of InAs/GaAs quantum dots (QDs) and InAs QDs emb...
InAs quantum dots (QDs), grown by molecular-beam epitaxy on GaAs(114)A surfaces, were studied in sit...
We present a cross-sectional scanning-tunneling microscopy investigation of the shape, size, and com...
We report on cross-sectional scanning tunneling microscopy studies of a quantum dot infrared photode...
In recent years, the self-assembled growth of semiconductor nanostructures, that show quantum size e...
Self-assembled InAs/AlAs quantum dots embedded in a resonant tunneling diode device structure are gr...
A deep level transient spectroscopy technique has been used to determine the emission activation ene...
InAs quantum dots (QDs) were prepared by molecular beam epitaxy on GaAs(-1-1-2)B substrates. Shape a...
This study compares cross-sectional scanning tunneling microscopy and atom probe tomography. We use ...
Cross-sectional scanning tunneling microscopy (X-STM) was employed to characterize the InAs submono-...
Deep-level transient spectroscopy and photoluminescence studies have been carried out on structures ...
InAs quantum dots (QD's) grown by molecular-beam epitaxy on high-index GaAs(-3-1-5)B substrates were...
This thesis describes an experimental study of the electronic properties of semiconductor heterostru...
InAs/GaAs quantum dot (QD) heterostructures grown by molecular beam epitaxy are studied using cross-...
We present a cross-sectional scanning tunneling microscopy (X-STM) investigation of InAs quantum dot...
We have determined the size, shape, and composition of InAs/GaAs quantum dots (QDs) and InAs QDs emb...
InAs quantum dots (QDs), grown by molecular-beam epitaxy on GaAs(114)A surfaces, were studied in sit...
We present a cross-sectional scanning-tunneling microscopy investigation of the shape, size, and com...
We report on cross-sectional scanning tunneling microscopy studies of a quantum dot infrared photode...
In recent years, the self-assembled growth of semiconductor nanostructures, that show quantum size e...
Self-assembled InAs/AlAs quantum dots embedded in a resonant tunneling diode device structure are gr...
A deep level transient spectroscopy technique has been used to determine the emission activation ene...
InAs quantum dots (QDs) were prepared by molecular beam epitaxy on GaAs(-1-1-2)B substrates. Shape a...
This study compares cross-sectional scanning tunneling microscopy and atom probe tomography. We use ...
Cross-sectional scanning tunneling microscopy (X-STM) was employed to characterize the InAs submono-...
Deep-level transient spectroscopy and photoluminescence studies have been carried out on structures ...
InAs quantum dots (QD's) grown by molecular-beam epitaxy on high-index GaAs(-3-1-5)B substrates were...
This thesis describes an experimental study of the electronic properties of semiconductor heterostru...