Measuring the angular profile of the reflection of xenon scintillation light

Measurement of X-ray scattering by optical surfaces

Wriston, R. S.

August 1973

Optical surfaces built for X-ray telescopes are made to reflect very short wavelengths that range in...

A NEW XENON LIGHT SOURCE FOR THE VACUUM ULTRAVIOLET

Wilkinson, P. G.
Tanaka, Y.

January 1954

Author Institution: Department of Physics, University of Chicago; Department of Physics, AIR Force C...

Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

M K Tiwari
B Gowrishankar
V K Raghuvanshi
R V Nandedkar
K J S Sawhney

January 2002

Abstract. A simple and fairly inexpensive total reflection X-ray fluorescence (TXRF) spectrometer ha...

Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Kravitz, S
Smith, RJ
Hagaman, L
Bernard, EP
McKinsey, DN
Rudd, L
Tvrznikova, L
Gann, GD Orebi
Sakai, M

March 2020

Liquid xenon particle detectors rely on excellent light collection efficiency for their performance....

Measurement of the absolute reflectance of polytetrafluoroethylene (PTFE) immersed in liquid xenon

Neves, F.
Lindote, A.
Morozov, A.
Solovov, V.
Silva, C.
Bras, P.
Rodrigues, J.P.
Lopes, M.I.

February 2019

The performance of a detector using liquid xenon (LXe) as a scintillator is strongly dependent on th...

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

Nakarmi, P. (P.)
Ostrovskiy, I. (I.)
Soma, A.K. (A. K.)
Retière, F. (F.)
Kharusi, S.Al. (S. Al)
Alfaris, M. (M.)
Anton, G. (G.)
Arnquist, I.J. (I. J.)
Badhrees, I. (I.)
Barbeau, P.S. (P. S.)
Beck, D. (D.)
Belov, V. (V.)
Bhatta, T. (T.)
Blatchford, J. (J.)
Breur, P.A. (P. A.)
Brodsky, J.P. (J. P.)
Brown, E. (E.)
Brunner, T. (T.)
Mamahit, S.B. (S. Byrne)
Caden, E. (E.)
Cao, G.F. (G. F.)
Cao, L. (L.)
Chambers, C. (C.)
Chana, B. (B.)
Charlebois, S.A. (S. A.)
Chiu, M. (M.)
Cleveland, B. (B.)
Coon, M. (M.)
Craycraft, A. (A.)
Dalmasson, J. (J.)
Daniels, T. (T.)
Darroch, L. (L.)
Croix, A.D.S. (A. De St.)
Mesrobian-Kabakian, A.D. (A. Der)
Devoe, R. (R.)
Vacri, M.L.D. (M.L. Di)
Dilling, J. (J.)
Ding, Y.Y. (Y. Y.)
Dolinski, M.J. (M. J.)
Doria, L. (L.)
Dragone, A. (A.)
Echevers, J. (J.)
Edaltafar, F. (F.)
Elbeltagi, M. (M.)
Fabris, L. (L.)
Fairbank, D. (D.)
Fairbank, W. (W.)
Farine, J. (J.)
Ferrara, S. (S.)
Feyzbakhsh, S. (S.)
Fontaine, R. (R.)
Fucarino, A. (A.)
Gallina, G. (G.)
Gautam, P. (P.)
Giacomini, G. (G.)
Goeldi, D. (D.)
Gornea, R.S. (Razvan Stefan)
Gratta, G. (G.)
Hansen, E.V. (E. V.)
Heffner, M. (M.)
Hoppe, E.W. (E. W.)
Hößl, J. (J.)
House, A. (A.)
Hughes, M. (M.)
Iverson, A. (A.)
Jamil, A. (A.)
Jewell, M.J. (M. J.)
Jiang, X.S. (X. S.)
Karelin, A. (A.)
Kaufman, L.J. (L. J.)
Koffas, T. (Thomas)
Krücken, R. (R.)
Kuchenkov, A. (A.)
Kumar, K.S. (K. S.)
Lan, Y. (Y.)
Larson, A. (A.)
Leach, K.G. (K. G.)
Lenardo, B.G. (B. G.)
Leonard, D.S. (D. S.)
Li, G. (G.)
Li, S. (S.)
Li, Z. (Z.)
Licciardi, C. (C.)
Lv, P. (P.)
Maclellan, R. (R.)
Massacret, N. (N.)
McElroy, T. (T.)
Medina-Peregrina, M. (M.)
Michel, T. (T.)
Mong, B. (B.)
Moore, D.C. (D. C.)
Murray, K. (K.)
Natzke, C.R. (C. R.)
Newby, R.J. (R. J.)
Ning, Z. (Z.)
Njoya, O. (O.)
Nolet, F. (F.)
Nusair, O. (O.)
Odgers, K. (K.)
Odian, A. (A.)
Oriunno, M. (M.)
Orrell, J.L. (J. L.)
Ortega, G.S. (G. S.)
Overman, C.T. (C. T.)
Parent, S. (S.)
Piepke, A. (A.)
Pocar, A. (A.)
Pratte, J.-F. (J. F.)
Radeka, V. (V.)
Raguzin, E. (E.)
Rescia, S. (S.)
Richman, M. (M.)
Robinson, A. (A.)
Rossignol, T. (T.)
Rowson, P.C. (P. C.)
Roy, N. (N.)
Runge, J. (J.)
Saldanha, R. (R.)
Sangiorgio, S. (S.)
Viii, K.S. (K. Skarpaas)
St-Hilaire, G. (G.)
Stekhanov, V. (V.)
Stiegler, T. (T.)
Sun, X.L. (X. L.)
Tarka, M. (M.)
Todd, J. (J.)
Totev, T.I. (T. I.)
Tsang, R. (R.)
Tsang, T. (T.)
Vachon, F. (F.)
Veeraraghavan, V. (V.)
Viel, S. (S.)
Visser, G. (G.)
Vivo-Vilches, C. (C.)
Vuilleumier, J.-L. (J. L.)
Wagenpfeil, M. (M.)
Wager, T. (T.)
Walent, M. (M.)
Wang, Q. (Q.)
Ward, M. (M.)
Watkins, J. (J.)
Weber, M. (M.)
Wei, W. (W.)
Wen, L.J. (L. J.)
Wichoski, U. (U.)
Wu, S.X. (S. X.)
Wu, W.H. (W. H.)
Wu, X. (X.)
Xia, Q. (Q.)
Yang, H. (H.)
Yang, L. (L.)
Zeldovich, O. (O.)
Zhao, J. (J.)
Zhou, Y. (Y.)
Ziegler, T. (T.)

January 2020

Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetecto...

An investigation of the total reflection of soft X-rays.

James Henry. Underwood (7689200)

January 1963

The design and construction of a vacuum reflectometer for the study of the total reflection of soft ...

Noble-gas liquid detectors: measurement of light diffusion and reflectivity on commonly adopted inner surface materials

Bricola, S.
Prata, M. C.
Raselli, G. L.
Rossella, M.
Vignoli, C.
MENEGOLLI, ALESSANDRO
PRATA, MICHELE

January 2007

Noble-gas liquids, such as xenon and argon, have been recently proposed as Vacuum Ultra Violet (VUV)...

Design of an Instrument to Measure Optical Reflectance of Scintillating Crystal Surfaces

Janecek, Martin

August 2008

In order for a Monte Carlo simulation to be accurate in predicting and optimizing the light collecti...

Measurement of the refractive index and attenuation length of liquid xenon for its scintillation light

Solovov, V. N.
Chepel, V.
Lopes, M. I.
Hitachi, A.
Marques, R. Ferreira
Policarpo, A. J. P. L.

January 2004

The attenuation length and refractive index of liquid xenon for its intrinsic scintillation light ([...

Conceptual Design Of Instrumentation To Measure The Diffraction Profile Of A Single Crystal At Bragg Angle Near π 2 By Using Synchrotron Radiation

Caticha-Ellis S.
Boyce R.
Winick H.

November 2015

X-ray diffraction at nearly normal incidence is becoming an increasing important tool in several app...

Development of a Spatially Resolved Optical Technique to Measure Temperature using Two-Photon Absorption of Xenon

Bednar, Natalie J.

January 2005

Under the supervision of Assistant Professor Scott T. Sanders, Pages: 95A new spatially resolved opt...

Reflectivity and photoelectron yield from copper in accelerators

La Francesca, E
Angelucci, M
Liedl, A
Spallino, L
Gonzalez, L A
Bellafont, I
Siewert, F
Sertsu, M G
Sokolov, A
Schäfers, F
Cimino, R

January 2020

For the design of high-performance particle accelerators and vacuum systems for high-energy collider...

Optical Reflectance Measurements for Commonly Used Reflectors

Janecek, Petr Martin

June 2009

When simulating light collection in scintillators, modeling the angular distribution of optical ligh...

Measurements of x-ray scattering from accelerator vacuum chamber surfaces, and comparison with an analytical model

G. F. Dugan
K. G. Sonnad
R. Cimino
T. Ishibashi
F. Schäfers

April 2015

This paper compares measurements and calculations of scattering of photons from technical vacuum cha...

Measurement of X-ray scattering by optical surfaces

Wriston, R. S.

August 1973

Optical surfaces built for X-ray telescopes are made to reflect very short wavelengths that range in...

A NEW XENON LIGHT SOURCE FOR THE VACUUM ULTRAVIOLET

Wilkinson, P. G.
Tanaka, Y.

January 1954

Author Institution: Department of Physics, University of Chicago; Department of Physics, AIR Force C...

Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

M K Tiwari
B Gowrishankar
V K Raghuvanshi
R V Nandedkar
K J S Sawhney

January 2002

Abstract. A simple and fairly inexpensive total reflection X-ray fluorescence (TXRF) spectrometer ha...

Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Kravitz, S
Smith, RJ
Hagaman, L
Bernard, EP
McKinsey, DN
Rudd, L
Tvrznikova, L
Gann, GD Orebi
Sakai, M

March 2020

Liquid xenon particle detectors rely on excellent light collection efficiency for their performance....

Measurement of the absolute reflectance of polytetrafluoroethylene (PTFE) immersed in liquid xenon

Neves, F.
Lindote, A.
Morozov, A.
Solovov, V.
Silva, C.
Bras, P.
Rodrigues, J.P.
Lopes, M.I.

February 2019

The performance of a detector using liquid xenon (LXe) as a scintillator is strongly dependent on th...

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

Nakarmi, P. (P.)
Ostrovskiy, I. (I.)
Soma, A.K. (A. K.)
Retière, F. (F.)
Kharusi, S.Al. (S. Al)
Alfaris, M. (M.)
Anton, G. (G.)
Arnquist, I.J. (I. J.)
Badhrees, I. (I.)
Barbeau, P.S. (P. S.)
Beck, D. (D.)
Belov, V. (V.)
Bhatta, T. (T.)
Blatchford, J. (J.)
Breur, P.A. (P. A.)
Brodsky, J.P. (J. P.)
Brown, E. (E.)
Brunner, T. (T.)
Mamahit, S.B. (S. Byrne)
Caden, E. (E.)
Cao, G.F. (G. F.)
Cao, L. (L.)
Chambers, C. (C.)
Chana, B. (B.)
Charlebois, S.A. (S. A.)
Chiu, M. (M.)
Cleveland, B. (B.)
Coon, M. (M.)
Craycraft, A. (A.)
Dalmasson, J. (J.)
Daniels, T. (T.)
Darroch, L. (L.)
Croix, A.D.S. (A. De St.)
Mesrobian-Kabakian, A.D. (A. Der)
Devoe, R. (R.)
Vacri, M.L.D. (M.L. Di)
Dilling, J. (J.)
Ding, Y.Y. (Y. Y.)
Dolinski, M.J. (M. J.)
Doria, L. (L.)
Dragone, A. (A.)
Echevers, J. (J.)
Edaltafar, F. (F.)
Elbeltagi, M. (M.)
Fabris, L. (L.)
Fairbank, D. (D.)
Fairbank, W. (W.)
Farine, J. (J.)
Ferrara, S. (S.)
Feyzbakhsh, S. (S.)
Fontaine, R. (R.)
Fucarino, A. (A.)
Gallina, G. (G.)
Gautam, P. (P.)
Giacomini, G. (G.)
Goeldi, D. (D.)
Gornea, R.S. (Razvan Stefan)
Gratta, G. (G.)
Hansen, E.V. (E. V.)
Heffner, M. (M.)
Hoppe, E.W. (E. W.)
Hößl, J. (J.)
House, A. (A.)
Hughes, M. (M.)
Iverson, A. (A.)
Jamil, A. (A.)
Jewell, M.J. (M. J.)
Jiang, X.S. (X. S.)
Karelin, A. (A.)
Kaufman, L.J. (L. J.)
Koffas, T. (Thomas)
Krücken, R. (R.)
Kuchenkov, A. (A.)
Kumar, K.S. (K. S.)
Lan, Y. (Y.)
Larson, A. (A.)
Leach, K.G. (K. G.)
Lenardo, B.G. (B. G.)
Leonard, D.S. (D. S.)
Li, G. (G.)
Li, S. (S.)
Li, Z. (Z.)
Licciardi, C. (C.)
Lv, P. (P.)
Maclellan, R. (R.)
Massacret, N. (N.)
McElroy, T. (T.)
Medina-Peregrina, M. (M.)
Michel, T. (T.)
Mong, B. (B.)
Moore, D.C. (D. C.)
Murray, K. (K.)
Natzke, C.R. (C. R.)
Newby, R.J. (R. J.)
Ning, Z. (Z.)
Njoya, O. (O.)
Nolet, F. (F.)
Nusair, O. (O.)
Odgers, K. (K.)
Odian, A. (A.)
Oriunno, M. (M.)
Orrell, J.L. (J. L.)
Ortega, G.S. (G. S.)
Overman, C.T. (C. T.)
Parent, S. (S.)
Piepke, A. (A.)
Pocar, A. (A.)
Pratte, J.-F. (J. F.)
Radeka, V. (V.)
Raguzin, E. (E.)
Rescia, S. (S.)
Richman, M. (M.)
Robinson, A. (A.)
Rossignol, T. (T.)
Rowson, P.C. (P. C.)
Roy, N. (N.)
Runge, J. (J.)
Saldanha, R. (R.)
Sangiorgio, S. (S.)
Viii, K.S. (K. Skarpaas)
St-Hilaire, G. (G.)
Stekhanov, V. (V.)
Stiegler, T. (T.)
Sun, X.L. (X. L.)
Tarka, M. (M.)
Todd, J. (J.)
Totev, T.I. (T. I.)
Tsang, R. (R.)
Tsang, T. (T.)
Vachon, F. (F.)
Veeraraghavan, V. (V.)
Viel, S. (S.)
Visser, G. (G.)
Vivo-Vilches, C. (C.)
Vuilleumier, J.-L. (J. L.)
Wagenpfeil, M. (M.)
Wager, T. (T.)
Walent, M. (M.)
Wang, Q. (Q.)
Ward, M. (M.)
Watkins, J. (J.)
Weber, M. (M.)
Wei, W. (W.)
Wen, L.J. (L. J.)
Wichoski, U. (U.)
Wu, S.X. (S. X.)
Wu, W.H. (W. H.)
Wu, X. (X.)
Xia, Q. (Q.)
Yang, H. (H.)
Yang, L. (L.)
Zeldovich, O. (O.)
Zhao, J. (J.)
Zhou, Y. (Y.)
Ziegler, T. (T.)

January 2020

Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetecto...

An investigation of the total reflection of soft X-rays.

James Henry. Underwood (7689200)

January 1963

The design and construction of a vacuum reflectometer for the study of the total reflection of soft ...

Noble-gas liquid detectors: measurement of light diffusion and reflectivity on commonly adopted inner surface materials

Bricola, S.
Prata, M. C.
Raselli, G. L.
Rossella, M.
Vignoli, C.
MENEGOLLI, ALESSANDRO
PRATA, MICHELE

January 2007

Noble-gas liquids, such as xenon and argon, have been recently proposed as Vacuum Ultra Violet (VUV)...

Design of an Instrument to Measure Optical Reflectance of Scintillating Crystal Surfaces

Janecek, Martin

August 2008

In order for a Monte Carlo simulation to be accurate in predicting and optimizing the light collecti...

Measurement of the refractive index and attenuation length of liquid xenon for its scintillation light

Solovov, V. N.
Chepel, V.
Lopes, M. I.
Hitachi, A.
Marques, R. Ferreira
Policarpo, A. J. P. L.

January 2004

The attenuation length and refractive index of liquid xenon for its intrinsic scintillation light ([...

Conceptual Design Of Instrumentation To Measure The Diffraction Profile Of A Single Crystal At Bragg Angle Near π 2 By Using Synchrotron Radiation

Caticha-Ellis S.
Boyce R.
Winick H.

November 2015

X-ray diffraction at nearly normal incidence is becoming an increasing important tool in several app...

Development of a Spatially Resolved Optical Technique to Measure Temperature using Two-Photon Absorption of Xenon

Bednar, Natalie J.

January 2005

Under the supervision of Assistant Professor Scott T. Sanders, Pages: 95A new spatially resolved opt...

Reflectivity and photoelectron yield from copper in accelerators

La Francesca, E
Angelucci, M
Liedl, A
Spallino, L
Gonzalez, L A
Bellafont, I
Siewert, F
Sertsu, M G
Sokolov, A
Schäfers, F
Cimino, R

January 2020

For the design of high-performance particle accelerators and vacuum systems for high-energy collider...

Optical Reflectance Measurements for Commonly Used Reflectors

Janecek, Petr Martin

June 2009

When simulating light collection in scintillators, modeling the angular distribution of optical ligh...

Measurements of x-ray scattering from accelerator vacuum chamber surfaces, and comparison with an analytical model

G. F. Dugan
K. G. Sonnad
R. Cimino
T. Ishibashi
F. Schäfers

April 2015

This paper compares measurements and calculations of scattering of photons from technical vacuum cha...

Measurement of X-ray scattering by optical surfaces

Wriston, R. S.

August 1973

Optical surfaces built for X-ray telescopes are made to reflect very short wavelengths that range in...

A NEW XENON LIGHT SOURCE FOR THE VACUUM ULTRAVIOLET

Wilkinson, P. G.
Tanaka, Y.

January 1954

Author Institution: Department of Physics, University of Chicago; Department of Physics, AIR Force C...

Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

M K Tiwari
B Gowrishankar
V K Raghuvanshi
R V Nandedkar
K J S Sawhney

January 2002

Abstract. A simple and fairly inexpensive total reflection X-ray fluorescence (TXRF) spectrometer ha...

Measuring the angular profile of the reflection of xenon scintillation light

Abstract

Extracted data

Measuring the angular profile of the reflection of xenon scintillation light

Abstract

Extracted data

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