A crystallographic indexing algorithm,pinkIndexer, is presented for the analysisof snapshot diffraction patterns. It can be used in a variety of contexts includingmeasurements made with a monochromatic radiation source, a polychromaticsource or with radiation of very short wavelength. As such, the algorithm isparticularly suited to automated data processing for two emerging measurementtechniques for macromolecular structure determination: serial pink-beam X-raycrystallography and serial electron crystallography, which until now lackedreliable programs for analyzing many individual diffraction patterns fromcrystals of uncorrelated orientation. The algorithm requires approximateknowledge of the unit-cell parameters of the crystal, but not the...
The indexing methods currently used for serial femtosecond crystallography were originally developed...
In serial crystallography, a very incomplete partial data set is obtained from each diffraction expe...
A new software is presented for the determination of crystal lattice parameters from the positions a...
A crystallographic indexing algorithm,pinkIndexer, is presented for the analysisof snapshot diffract...
A novel algorithm for indexing multiple crystals in snapshot X-ray diffraction images, especially su...
Serial crystallography records still diffraction patterns from single, randomly oriented crystals, t...
We present improved methods for indexing diffraction patterns from macromolecular crystals. The nove...
Serial crystallography data can be challenging to index, as each frame is processed individually, ra...
Recent developments of two-color operation modes at X-ray free-electron laser facilities provide new...
Serial crystallography, initially developed for use at X-ray free-electron lasers, has openednew opp...
Serial X-ray crystallography allows macromolecular structure determination at both X-ray free electr...
The indexing methods currently used for serial femtosecond crystallography were originally developed...
A rapid computer technique to index electron diffraction spot patterns from any crystal structure i...
Still diffraction patterns from peptide nanocrystals with small unit cells are challenging to index ...
The development of a crystal indexing computer program using interplanar angles and lattice spacings...
The indexing methods currently used for serial femtosecond crystallography were originally developed...
In serial crystallography, a very incomplete partial data set is obtained from each diffraction expe...
A new software is presented for the determination of crystal lattice parameters from the positions a...
A crystallographic indexing algorithm,pinkIndexer, is presented for the analysisof snapshot diffract...
A novel algorithm for indexing multiple crystals in snapshot X-ray diffraction images, especially su...
Serial crystallography records still diffraction patterns from single, randomly oriented crystals, t...
We present improved methods for indexing diffraction patterns from macromolecular crystals. The nove...
Serial crystallography data can be challenging to index, as each frame is processed individually, ra...
Recent developments of two-color operation modes at X-ray free-electron laser facilities provide new...
Serial crystallography, initially developed for use at X-ray free-electron lasers, has openednew opp...
Serial X-ray crystallography allows macromolecular structure determination at both X-ray free electr...
The indexing methods currently used for serial femtosecond crystallography were originally developed...
A rapid computer technique to index electron diffraction spot patterns from any crystal structure i...
Still diffraction patterns from peptide nanocrystals with small unit cells are challenging to index ...
The development of a crystal indexing computer program using interplanar angles and lattice spacings...
The indexing methods currently used for serial femtosecond crystallography were originally developed...
In serial crystallography, a very incomplete partial data set is obtained from each diffraction expe...
A new software is presented for the determination of crystal lattice parameters from the positions a...