Structural and Electrical Properties of Pulsed Laser Deposited Yttrium Doped Zirconium Oxide Thin Film Stabilization

Solid Oxide Fuel Cells are devices that use a series of electrochemical reactions to convert chemical energy from fuel into electricity. These fuels, such as Hydrogen (H2), Carbon Monoxide (CO), and Oxygen (O2), have a high conversion efficiency. Solid Oxide Fuel Cells, in comparison to coal power plants, produce a higher electrical conversion efficiency. Solid Oxide Fuel Cells are a possible candidate for energy production. However, Solid Oxide Fuel Cell’s high temperatures (800-1000 degrees Celsius) create a lower ionic conductivity of the electrolytes. This ionic conductivity limits Solid Oxide Fuel Cell applications. When decreasing the temperatures, the ohmic resistance, as a thin film, increases. In our research an Yttria Stabilized Zirconia layer is produced from the fine dimple grain structure allowing high flow of oxygen mobility. This ion mobility increases the ionic conductivity and decreases the ohmic losses. The goal of our research is to determine the Yttria Stabilized Zirconia thin film synthesis conditions which lead to minimum ohmic resistance in these films. The method that we will use is to test different molecular ratios of Yttrium (III) Oxide (Y2O3) and Zirconium (IV) Oxide (ZrO2) and deposit these different ratios onto the substrates. We will also use different substrates and monitor the effect each substrate on the Yttria Stabilized Zirconia thin film properties. These thin films will be characterized through electrical measurements such as Four Point Probe Resistivity measurements as well as structural and compositional characterization through Atomic Force Microscopy, Scanning Electron Microscope, and Energy Dispersive X-Ray Spectroscopy