This paper presents an accelerated life testing method applicable to devices or systems when no analytical relationship with respect to the stress level can be defined. If a numerical approach remains possible, the numerical model can be fitted to the accelerated test results. Thus, long-term failures can be predicted from short tests. This method is carried out in the case of fatigue, the evolution of the damage leading to the failure having to be modeled by a numerical finite element method
Accelerated Life Testing (ALT) is frequently used to obtain information on the lifespan of devices. ...
International audienceIn classical life data analysis, one typically collects failure-time data by o...
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
This paper presents an accelerated life testing method applicable to devices or systems when no anal...
This chapter presents an overview of using accelerated life testing (ALT) models for reliability est...
Accelerated life tests are used to obtain quickly information about the failure time distribution of...
Accelerated life testing (ALT) is a method for estimating the reliability of products at normal oper...
Abdelkhalak EL HAMI : Rapporteur, Professeur à l'INSA de RouenOlivier GAUDOIN : Rapporteur, Professe...
Failure of highly reliable units are rare and it may be not possible to gather the failure time data...
Accelerated life testing provides an interesting challenge for quantification of the uncertainties i...
Abstract: Accelerated Life Testing (ALT) is an efficient approach to obtain failure observations by ...
AbstractWith the recent products being more reliable, engineers cannot obtain enough failure or degr...
Life testing is a necessary step to assess life time distributions of materials and products. Since ...
Testing the reliability at a nominal stress level may lead to extensive test time. Estimations of re...
In order to gather the information about the lifetime distribution of a product, a standard life tes...
Accelerated Life Testing (ALT) is frequently used to obtain information on the lifespan of devices. ...
International audienceIn classical life data analysis, one typically collects failure-time data by o...
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
This paper presents an accelerated life testing method applicable to devices or systems when no anal...
This chapter presents an overview of using accelerated life testing (ALT) models for reliability est...
Accelerated life tests are used to obtain quickly information about the failure time distribution of...
Accelerated life testing (ALT) is a method for estimating the reliability of products at normal oper...
Abdelkhalak EL HAMI : Rapporteur, Professeur à l'INSA de RouenOlivier GAUDOIN : Rapporteur, Professe...
Failure of highly reliable units are rare and it may be not possible to gather the failure time data...
Accelerated life testing provides an interesting challenge for quantification of the uncertainties i...
Abstract: Accelerated Life Testing (ALT) is an efficient approach to obtain failure observations by ...
AbstractWith the recent products being more reliable, engineers cannot obtain enough failure or degr...
Life testing is a necessary step to assess life time distributions of materials and products. Since ...
Testing the reliability at a nominal stress level may lead to extensive test time. Estimations of re...
In order to gather the information about the lifetime distribution of a product, a standard life tes...
Accelerated Life Testing (ALT) is frequently used to obtain information on the lifespan of devices. ...
International audienceIn classical life data analysis, one typically collects failure-time data by o...
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....