Errors in measurements of surface resistance R(s) of HTS materials are due to discrepancy between a mathematical model describing physical phenomena and a real measurement environment, finite accuracy of measurements of the Q-factor, and finite accuracy of constants used for calculation of R(s). In this paper we analyze errors in R(s) due to uncertainties in the Q-factor, geometrical coefficients, loss tangent, R(scu), and other factors when a cylindrical copper cavity with an HTS end plate, a stripline resonator, and sapphire rod resonators are used for HTS characterization
The dielectric resonator technique is recognised as the best method for the measurement of surface r...
The performance of several designs of dielectric resonators used for microwave characterization of F...
Precise designs are presented for sapphire rod resonators of three types, which have been proposed b...
Errors in measurements of surface resistance R(s) of HTS materials are due to discrepancy between a ...
This paper discusses accuracy of loss measurements of High Temperature Superconductors (HTS) using t...
It has been shown in the past that a random uncertainty in surface resistance measurements of HTS fi...
Reproducible and accurate measurements of the surface resistance of high temperature superconductors...
copyright(c)2003 IEICE 許諾番号:07RB0174 http://www.ieice.org/jpn/trans_online/index.htmlThe frequency ...
The work presented in this thesis belongs to the area of microwave characterisation of High Temperat...
Reproducible and accurate measurements of the surface resistance of high temperature superconductors...
Microwave characterization of HTS films, using typically a sapphire dielectric resonator can only be...
Superconducting material properties such as energy gap, mean free path or residual resistance are c...
The dielectric resonator technique is commonly used for microwave surface resistance measurements of...
[Extract] Commercialisation of High Temperature Superconducting microwave circuits to communication ...
copyright(c)2003 IEICE 許諾番号:07RB0174A new measurement method using two resonance modes, the TE_021 a...
The dielectric resonator technique is recognised as the best method for the measurement of surface r...
The performance of several designs of dielectric resonators used for microwave characterization of F...
Precise designs are presented for sapphire rod resonators of three types, which have been proposed b...
Errors in measurements of surface resistance R(s) of HTS materials are due to discrepancy between a ...
This paper discusses accuracy of loss measurements of High Temperature Superconductors (HTS) using t...
It has been shown in the past that a random uncertainty in surface resistance measurements of HTS fi...
Reproducible and accurate measurements of the surface resistance of high temperature superconductors...
copyright(c)2003 IEICE 許諾番号:07RB0174 http://www.ieice.org/jpn/trans_online/index.htmlThe frequency ...
The work presented in this thesis belongs to the area of microwave characterisation of High Temperat...
Reproducible and accurate measurements of the surface resistance of high temperature superconductors...
Microwave characterization of HTS films, using typically a sapphire dielectric resonator can only be...
Superconducting material properties such as energy gap, mean free path or residual resistance are c...
The dielectric resonator technique is commonly used for microwave surface resistance measurements of...
[Extract] Commercialisation of High Temperature Superconducting microwave circuits to communication ...
copyright(c)2003 IEICE 許諾番号:07RB0174A new measurement method using two resonance modes, the TE_021 a...
The dielectric resonator technique is recognised as the best method for the measurement of surface r...
The performance of several designs of dielectric resonators used for microwave characterization of F...
Precise designs are presented for sapphire rod resonators of three types, which have been proposed b...