A comparative study with CF4 and SiF4 molecules
- Ohtomi, S.
- Matsui, M.
- Mochizuki, Y.
- Suga, A.
- Kato, H.
- Hoshino, M.
- Duflot, D.
- Limão-Vieira, P.
- Tanaka, Hideaki
Publication date
September 2015
DOI Publisher
IOP Publishing Journal
Journal of Physics Conference SeriesAbstract
We report on the measurements of the electron impact electronic excitation cross sections for XF4 (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF4 molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range.publishersversionpublishe
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