Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally introduced to study the surface elastic properties of stiff materials. We report elastic images of heterogeneous nanostructures with a lateral resolution of the order of a few nanometres. One of the main intentions of this paper is not only to show the capability of UFM to allow one to image surface elastic properties of stiff materials but also to show that UFM can be applied to relatively soft materials with reproducible and interpretable results. The samples presented were chosen over a wide range of stiffness values (with Young's modulus E = 0.1-400 GPa): very stiff silicon carbide fibres embedded in a mullite matrix, less stiff carbon fib...
We present measurements of the nanoscale elastic and viscoelastic properties of samples of poly(meth...
The science and technology of thin films require the development of nondestructive methods for their...
Cantilever-based optical interfacial force microscopy (COIFM) was applied to the investigation of th...
Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally i...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
Ultrasonic force microscopy (UFM) was introduced to probe nanoscale mechanical properties of stiff m...
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
This chapter describes an approach that depends on the nonlinear nature of the interaction between t...
Imaging of nanoscale structures buried in a covering material is an extremely challenging task, but ...
Atomic force microscopy (AFM) has emerged as a popular tool for the mechanical mapping of soft nanom...
The structure of nanometer-sized strained Ce islands epitaxially grown on a Si substrate was studied...
Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced n...
Scanning probe microscopy (SPM) represents a powerful tool that, in the past 30 years, has allowed f...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
In the work presented here atomic force microscopy (AFM) based mechanical mapping techniques - Harmo...
We present measurements of the nanoscale elastic and viscoelastic properties of samples of poly(meth...
The science and technology of thin films require the development of nondestructive methods for their...
Cantilever-based optical interfacial force microscopy (COIFM) was applied to the investigation of th...
Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally i...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
Ultrasonic force microscopy (UFM) was introduced to probe nanoscale mechanical properties of stiff m...
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
This chapter describes an approach that depends on the nonlinear nature of the interaction between t...
Imaging of nanoscale structures buried in a covering material is an extremely challenging task, but ...
Atomic force microscopy (AFM) has emerged as a popular tool for the mechanical mapping of soft nanom...
The structure of nanometer-sized strained Ce islands epitaxially grown on a Si substrate was studied...
Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced n...
Scanning probe microscopy (SPM) represents a powerful tool that, in the past 30 years, has allowed f...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
In the work presented here atomic force microscopy (AFM) based mechanical mapping techniques - Harmo...
We present measurements of the nanoscale elastic and viscoelastic properties of samples of poly(meth...
The science and technology of thin films require the development of nondestructive methods for their...
Cantilever-based optical interfacial force microscopy (COIFM) was applied to the investigation of th...