Semiconductor devices have rapidly improved in performance and function density over the past 25 years enabled by the continuous shrinking of technology feature sizes. Fabricating transistors that small, even with advanced processes, results in structural irregularities at the atomic scale, which affect device characteristics in a random manner. To simulate performance of circuits comprising a large number of devices using statistical models and ensuring low failure rates, performance outliers are required to be investigated. Standard Monte Carlo analysis will quickly become intractable because of the large number of circuit simulations required. Cases where the number of samples exceeds are known as “high-sigma problems”. This work propose...
This empirical inquiry explores the behaviour of a particular class of evolutionary algorithms as th...
In nanometer complementary metal-oxide-semiconductor technologies, worst-case design methods and res...
This paper presents a new real-world application of evolutionary computing in the area of digital ci...
Semiconductor devices have rapidly improved in performance and function density over the past 25 yea...
Statistical circuit simulation exhibits increasing importance for circuit designs under process vari...
A new algorithm is presented that combines performance and variation objectives in a behavioural mod...
In this study, the authors present a design optimisation case study of D-type flip-flop timing chara...
The impact of within-die transistor variability has increased with CMOS technology scaling up to the...
Accurately estimating the rare failure rates for nanoscale circuit blocks (e.g., SRAM, DFF, etc.) is...
As semiconductor industry kept shrinking the feature size to nanometer scale, circuit reliability ha...
SRAM (static random-access memory) has been widely embedded in a large amount of semiconductor chips...
A new approach in hierarchical optimisation is presented which is capable of optimising both the per...
Intrinsic variability occurs between individual MOSFET transistors caused by atomic-scale difference...
Intrinsic variability occurs between individual MOSFET transistors caused by atomic-scale difference...
The intrinsic variability of nanoscale VLSI technology must be taken into account when analyzing cir...
This empirical inquiry explores the behaviour of a particular class of evolutionary algorithms as th...
In nanometer complementary metal-oxide-semiconductor technologies, worst-case design methods and res...
This paper presents a new real-world application of evolutionary computing in the area of digital ci...
Semiconductor devices have rapidly improved in performance and function density over the past 25 yea...
Statistical circuit simulation exhibits increasing importance for circuit designs under process vari...
A new algorithm is presented that combines performance and variation objectives in a behavioural mod...
In this study, the authors present a design optimisation case study of D-type flip-flop timing chara...
The impact of within-die transistor variability has increased with CMOS technology scaling up to the...
Accurately estimating the rare failure rates for nanoscale circuit blocks (e.g., SRAM, DFF, etc.) is...
As semiconductor industry kept shrinking the feature size to nanometer scale, circuit reliability ha...
SRAM (static random-access memory) has been widely embedded in a large amount of semiconductor chips...
A new approach in hierarchical optimisation is presented which is capable of optimising both the per...
Intrinsic variability occurs between individual MOSFET transistors caused by atomic-scale difference...
Intrinsic variability occurs between individual MOSFET transistors caused by atomic-scale difference...
The intrinsic variability of nanoscale VLSI technology must be taken into account when analyzing cir...
This empirical inquiry explores the behaviour of a particular class of evolutionary algorithms as th...
In nanometer complementary metal-oxide-semiconductor technologies, worst-case design methods and res...
This paper presents a new real-world application of evolutionary computing in the area of digital ci...