Add to ORKGForce microscopy in vacuum with atomic resolution / F. J. Giessibl. – In: Preliminary proceedings of STM / ed. by Y. Kuk ... - Seoul, 1999. – S. 19-2
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
The use of heterodyne laser Doppler interferometry for the measurement of the vibration of atomic fo...
Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficu...
Force microscopy in vacuum with atomic resolution / F. J. Giessibl. – In: Preliminary proceedings of...
Pushing the resolution limits of the force microscope : from steps to atoms and atomic orbitals / F....
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its ...
Principle of high-resolution atomic force microscopy / F. J. Giessibl. – In: Fundamentals of nanoele...
Since its invention in 1986, atomic force microscopy (AFM) has been used mainly in ambient condition...
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to genera...
We review progress in improving the spatial resolution of atomic force microscopy (AFM) under vacuum...
True atomic resolution in vacuum with a force microscope is now obtained routinely by using the freq...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the ...
The essence of the work presented here is the introduction, the advance in theoretical understanding...
Noncontact atomic force microscopy and its related topics / F. J. Giessibl ... - In: Springer handbo...
Abstract. We review the results of theoretical modelling of scanning force microscopy and discuss th...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
The use of heterodyne laser Doppler interferometry for the measurement of the vibration of atomic fo...
Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficu...
Force microscopy in vacuum with atomic resolution / F. J. Giessibl. – In: Preliminary proceedings of...
Pushing the resolution limits of the force microscope : from steps to atoms and atomic orbitals / F....
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its ...
Principle of high-resolution atomic force microscopy / F. J. Giessibl. – In: Fundamentals of nanoele...
Since its invention in 1986, atomic force microscopy (AFM) has been used mainly in ambient condition...
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to genera...
We review progress in improving the spatial resolution of atomic force microscopy (AFM) under vacuum...
True atomic resolution in vacuum with a force microscope is now obtained routinely by using the freq...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the ...
The essence of the work presented here is the introduction, the advance in theoretical understanding...
Noncontact atomic force microscopy and its related topics / F. J. Giessibl ... - In: Springer handbo...
Abstract. We review the results of theoretical modelling of scanning force microscopy and discuss th...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
The use of heterodyne laser Doppler interferometry for the measurement of the vibration of atomic fo...
Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficu...