Add to ORKGA direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy / F. J. Giessibl. – In: Applied physics letters. 78. 2001. S. 123-12
The critical quantity in understanding imaging using an atomic force microscope is the force the sam...
The essence of the work presented here is the introduction, the advance in theoretical understanding...
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile too...
A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic ...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
frequency-modulation atomic force microscopy; force deconvolution; numerical implementatio
True atomic resolution in vacuum with a force microscope is now obtained routinely by using the freq...
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their a...
Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semicond...
We propose a force-spectroscopy technique where a higher order mode of a cantilever is excited simul...
The quantification of the tip–sample interaction in amplitude modulation atomic force microscopy is ...
This article is part of the Thematic Series "Noncontact atomic force microscopy".Bimodal atomic forc...
Quantifying the tip-sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM...
The definition of the time varying force on a tip with internal degrees of freedom in atomistic mole...
The critical quantity in understanding imaging using an atomic force microscope is the force the sam...
The essence of the work presented here is the introduction, the advance in theoretical understanding...
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile too...
A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic ...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
frequency-modulation atomic force microscopy; force deconvolution; numerical implementatio
True atomic resolution in vacuum with a force microscope is now obtained routinely by using the freq...
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their a...
Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semicond...
We propose a force-spectroscopy technique where a higher order mode of a cantilever is excited simul...
The quantification of the tip–sample interaction in amplitude modulation atomic force microscopy is ...
This article is part of the Thematic Series "Noncontact atomic force microscopy".Bimodal atomic forc...
Quantifying the tip-sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM...
The definition of the time varying force on a tip with internal degrees of freedom in atomistic mole...
The critical quantity in understanding imaging using an atomic force microscope is the force the sam...
The essence of the work presented here is the introduction, the advance in theoretical understanding...
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile too...