Add to ORKGThis paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical charges needed to flip the output from low to high (0-1) and high to low (1-0) on different configurations of C-elements. The comparisons of C-elements in term of the resistivity toward soft error are presented
Soft errors resulting from the impact of charged particles are emerging as a major issue in the desi...
Microelectronic devices and systems have been extensively utilized in a variety of radiation environ...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
This paper presents current injection resemble single event upset (SEU) current at the vulnerable no...
This paper presents current injection resemble single event upset (SEU) current at the vulnerable no...
Soft errors are a serious concern in state holders as it can cause temporarily malfunction of the ci...
Soft errors are a serious concern in state holders as it can cause temporarily malfunction of the ci...
In this paper, we address the issue of analyzing the effects of aging mechanisms on ICs' soft error ...
In this paper we address the issue of analyzing the effects of negative bias temperature instability...
In this paper we address the issue of analyzing the effects of negative bias temperature instability...
In this paper, we address the issue of analyzing the effects of aging mechanisms on ICs' soft error ...
Technology scaling relies on reduced nodal capacitances and lower voltages in order to improve perfo...
International audience-Higher density of integration and lower power technologies are becoming more ...
Soft errors resulting from the impact of charged particles are emerging as a major issue in the desi...
Microelectronic devices and systems have been extensively utilized in a variety of radiation environ...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
This paper presents current injection resemble single event upset (SEU) current at the vulnerable no...
This paper presents current injection resemble single event upset (SEU) current at the vulnerable no...
Soft errors are a serious concern in state holders as it can cause temporarily malfunction of the ci...
Soft errors are a serious concern in state holders as it can cause temporarily malfunction of the ci...
In this paper, we address the issue of analyzing the effects of aging mechanisms on ICs' soft error ...
In this paper we address the issue of analyzing the effects of negative bias temperature instability...
In this paper we address the issue of analyzing the effects of negative bias temperature instability...
In this paper, we address the issue of analyzing the effects of aging mechanisms on ICs' soft error ...
Technology scaling relies on reduced nodal capacitances and lower voltages in order to improve perfo...
International audience-Higher density of integration and lower power technologies are becoming more ...
Soft errors resulting from the impact of charged particles are emerging as a major issue in the desi...
Microelectronic devices and systems have been extensively utilized in a variety of radiation environ...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...