Diese Arbeit befaßt sich mit der SAW-STM-Methode, einer Abwandlung der Rastertunnelmikroskopie (engl. scanning tunneling microscopy) zur hochauflösenden Abbildung akustischer Oberflächenwellen (engl. surface acoustic wave). Das Meßprinzip des SAW-STM beruht auf der Modulation des Tunnelabstandes und der hieraus resultierenden Modulation des Tunnelstroms durch die oszillatorische Bewegung der Probenoberfläche. Zur einfacheren Signaldetektion wird ein Heterodyn-Verfahren verwendet, das über eine zusätzliche Modulation der Tunnelspannung das SAW-STM Signal in den kHz-Frequenzbereich verschiebt. Dieses trägt die komplette Information über die Amplitude und die Phase der Tunnelabstandsmodulation. Im Rahmen dieser Arbeit wird die Abhängigkeit des...
De par leur nature purement passive, les capteurs utilisant la technologie SAW (Surface Acoustic Wav...
With the increasing interest in nanostructures and thin films, the need for a quantitative measuring...
Elastic properties of nanoscopic materials, structures and thin films are important parameters contr...
A method is presented for the universal probing of surface acoustic waves (SAWs). For measuring high...
The scanning acoustic tunneling microscope (SATM) which is based on a scanning tunneling microscope,...
In this paper we report the observation of surface acoustic waves using a scanning tunneling microsc...
Ce travail rentre dans le cadre de la caractérisation des couches minces, de revêtements et de surfa...
This paper describes a new type of acoustic microscope based upon a scanning tunneling microscope (S...
We present a novel method for the investigation of surface acoustic wave (SAW) fields with nanometer...
This paper reports about the first determination of the phase velocity of surface acoustic waves (SA...
Für das Verständnis von biologischen Membranen ist die Entschlüsselung der physikalischen Interaktio...
International audienceMapping the energy distribution of Surface Acoustic Wave (SAW) devices operati...
Outre leur utilisation massive dans l’industrie des télécommunications, les ondes acoustiques de sur...
La thèse traite des capteurs à ondes élastiques de surface (SAW) et plus particulièrement de leur ap...
We present a scanning acoustic force microscope (SAFM) for the study of surface acoustic wave (SAW) ...
De par leur nature purement passive, les capteurs utilisant la technologie SAW (Surface Acoustic Wav...
With the increasing interest in nanostructures and thin films, the need for a quantitative measuring...
Elastic properties of nanoscopic materials, structures and thin films are important parameters contr...
A method is presented for the universal probing of surface acoustic waves (SAWs). For measuring high...
The scanning acoustic tunneling microscope (SATM) which is based on a scanning tunneling microscope,...
In this paper we report the observation of surface acoustic waves using a scanning tunneling microsc...
Ce travail rentre dans le cadre de la caractérisation des couches minces, de revêtements et de surfa...
This paper describes a new type of acoustic microscope based upon a scanning tunneling microscope (S...
We present a novel method for the investigation of surface acoustic wave (SAW) fields with nanometer...
This paper reports about the first determination of the phase velocity of surface acoustic waves (SA...
Für das Verständnis von biologischen Membranen ist die Entschlüsselung der physikalischen Interaktio...
International audienceMapping the energy distribution of Surface Acoustic Wave (SAW) devices operati...
Outre leur utilisation massive dans l’industrie des télécommunications, les ondes acoustiques de sur...
La thèse traite des capteurs à ondes élastiques de surface (SAW) et plus particulièrement de leur ap...
We present a scanning acoustic force microscope (SAFM) for the study of surface acoustic wave (SAW) ...
De par leur nature purement passive, les capteurs utilisant la technologie SAW (Surface Acoustic Wav...
With the increasing interest in nanostructures and thin films, the need for a quantitative measuring...
Elastic properties of nanoscopic materials, structures and thin films are important parameters contr...