Mapping the Local Density of States by Very Low Energy Scanning Electron Microscope

Single crystal and polycrystalline aluminium samples were imaged in the scanning low energy electron microscopes at energies of impinging electrons ranging between 0 and 90 eV. The integrated image signal at each energy was calculated and the resulting reflectance curves were compared to electron structure calculations. The influence of vacuum conditions and cleanliness of the substrate surface are discussed