The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena, making soft errors an important challenge in future microprocessors. New techniques for detecting errors in the logic and memories that allow meeting the desired failure rate are key to keep harnessing the benefits of Moore's law. This paper proposes a low-cost dynamic particle strike detection mechanism based on acoustic wave detectors. Our results show that the proposed mechanism can protect the whole chip, including both the logic and the memory arrays, and detect all the soft errors caused by particle strikes with minimal hardware overhead and performance cost.Peer Reviewe
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The trend of downsizing transistors and operating voltage scaling has made the processor chip more s...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
The vulnerability of the current and future processors towards transient errors caused by particle s...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The trend of downsizing transistors and operating voltage scaling has made the processor chip more s...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
The vulnerability of the current and future processors towards transient errors caused by particle s...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
As the devices are scaling down, the combinational logic will become susceptible to soft errors. The...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...