Add to ORKGCommercially available Environmental and Low Vacuum scanning electron microscopy permits a low pressure of gas in the specimen chamber. These instruments are possible to be used for observing of uncoated nonconductive or pure conductive or water containing specimens without the necessary dryingand using other special preparation techniques. Contemporarily, these microscopes come in use mainly in biology, medicine, as well as in the semiconductor industry
The charging effects are encountered very often when the semiconductor specimens are observed. There...
The effect of the electron beam skirting on the emission and detection of the backscattered electron...
Progress in the processing of wet tissues, without the need of fixation and complex preparation proc...
Observation of specimens at a low vacuum in the specimen chamber brings some advantages in compariso...
The environmental scanning microscope is based on convenient adaptation of classical SEM employing t...
Environmental scanning electron microscopy exploits presence of gas or water vapour in the specimen ...
The environmental scanning electron microscopy (ESEM) allows the investigation not only of as-receiv...
Scanning Electron Microscope (SEM) is a powerful research tool, but since it requires high vacuum co...
in this work, we studied the electron beam scattering due to the introduction of two gases : water v...
Using Environmental Scanning Electron Microscope (ESEM), which uses high gas pressure within the spe...
The aim of the present study was to investigate the efficacy of environmental scanning electron micr...
Using Environmental Scanning Electron Microscope (ESEM), which uses high gas pressure within the spe...
This work is focused on the problems of designing, realisation and implementation of the new equipme...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
The charging effects are encountered very often when the semiconductor specimens are observed. There...
The effect of the electron beam skirting on the emission and detection of the backscattered electron...
Progress in the processing of wet tissues, without the need of fixation and complex preparation proc...
Observation of specimens at a low vacuum in the specimen chamber brings some advantages in compariso...
The environmental scanning microscope is based on convenient adaptation of classical SEM employing t...
Environmental scanning electron microscopy exploits presence of gas or water vapour in the specimen ...
The environmental scanning electron microscopy (ESEM) allows the investigation not only of as-receiv...
Scanning Electron Microscope (SEM) is a powerful research tool, but since it requires high vacuum co...
in this work, we studied the electron beam scattering due to the introduction of two gases : water v...
Using Environmental Scanning Electron Microscope (ESEM), which uses high gas pressure within the spe...
The aim of the present study was to investigate the efficacy of environmental scanning electron micr...
Using Environmental Scanning Electron Microscope (ESEM), which uses high gas pressure within the spe...
This work is focused on the problems of designing, realisation and implementation of the new equipme...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
The charging effects are encountered very often when the semiconductor specimens are observed. There...
The effect of the electron beam skirting on the emission and detection of the backscattered electron...
Progress in the processing of wet tissues, without the need of fixation and complex preparation proc...