Environmental scanning electron microscopy exploits presence of gas or water vapour in the specimen chamber. Molecules of the gaseous environment can be ionised by electrons, which can compensate the surface charge on thespecimen (at the pressure approx. 200 Pa). At higher pressure of gases and water vapour in the specimen chamber (more than 609 Pa) specimens with content of water can be observed
When we are detecting signal electrons with an ionization detector in ESEM, the most advantageous is...
Environmental scanning electron microscope differs from the conventional one in the presence of a sp...
Using the combination of off-axis electron holography and environmental Transmission Electron Micros...
The environmental scanning microscope is based on convenient adaptation of classical SEM employing t...
Commercially available Environmental and Low Vacuum scanning electron microscopy permits a low press...
The charging effects are encountered very often when the semiconductor specimens are observed. There...
In the environmental scanning electron microscope (ESEM), the gas flow around the main pressure limi...
in this work, we studied the electron beam scattering due to the introduction of two gases : water v...
The environmental scanning electron microscopy (ESEM) allows the investigation not only of as-receiv...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
We present a new model for the gas amplification effect used in many environmental scanning electron...
One of the recent directions in the field of scanning electron microscopy deals with observation of ...
Environmental scanning electron microscopy (ESEM) enables electron imaging of gas-mediated, direct-w...
Scanning Electron Microscope (SEM) is a powerful research tool, but since it requires high vacuum co...
When we are detecting signal electrons with an ionization detector in ESEM, the most advantageous is...
Environmental scanning electron microscope differs from the conventional one in the presence of a sp...
Using the combination of off-axis electron holography and environmental Transmission Electron Micros...
The environmental scanning microscope is based on convenient adaptation of classical SEM employing t...
Commercially available Environmental and Low Vacuum scanning electron microscopy permits a low press...
The charging effects are encountered very often when the semiconductor specimens are observed. There...
In the environmental scanning electron microscope (ESEM), the gas flow around the main pressure limi...
in this work, we studied the electron beam scattering due to the introduction of two gases : water v...
The environmental scanning electron microscopy (ESEM) allows the investigation not only of as-receiv...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
The usage of an Environmental scanning electron microscope (ESEM) brings the possibility of studying...
We present a new model for the gas amplification effect used in many environmental scanning electron...
One of the recent directions in the field of scanning electron microscopy deals with observation of ...
Environmental scanning electron microscopy (ESEM) enables electron imaging of gas-mediated, direct-w...
Scanning Electron Microscope (SEM) is a powerful research tool, but since it requires high vacuum co...
When we are detecting signal electrons with an ionization detector in ESEM, the most advantageous is...
Environmental scanning electron microscope differs from the conventional one in the presence of a sp...
Using the combination of off-axis electron holography and environmental Transmission Electron Micros...