Add to ORKGWe develop a simple model that computes the probability that a strike at the output of a gate has an impact in any output by traversing the circuits backwards from the outputs and gaining information about the logical masking using signal probabilities. The model is validated with fault injectio
Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une pa...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
ISBN:978-1-4244-4321-5International audienceEvaluating the potential functional effects of soft erro...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...
The main objective of this thesis is to develop techniques that can beused to analyze and mitigate t...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
International audienceTechnology scaling in modern electronic circuits shrinks the transistor size a...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Reliability of VLSI circuits had always been a major issue during the design process. It becomes mor...
Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility...
Due to shrinking feature size and significant reduction in noise margins, as we are moving into very...
Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une pa...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
ISBN:978-1-4244-4321-5International audienceEvaluating the potential functional effects of soft erro...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...
The main objective of this thesis is to develop techniques that can beused to analyze and mitigate t...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
International audienceTechnology scaling in modern electronic circuits shrinks the transistor size a...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Reliability of VLSI circuits had always been a major issue during the design process. It becomes mor...
Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility...
Due to shrinking feature size and significant reduction in noise margins, as we are moving into very...
Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une pa...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
ISBN:978-1-4244-4321-5International audienceEvaluating the potential functional effects of soft erro...