The proactive reconfiguration is an emerging technique that enlarges the lifetime of memory systems with embedded SRAM cells. This work introduces a novel version that modifies and enhances the advantages of this technique and furthermore it takes into account the process variability impact on the memory components. Our results show between a 30% and a 45% of system lifetime increase over the existing proactive reconfiguration technique and 1.7X to ~10X improvement to non-proactive reconfiguration one
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Gain-cell embedded DRAM (GC-eDRAM) is a dense, low power option for embedded memory implementation, ...
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
The proactive reconfiguration is an emerging technique that enlarges the lifetime of memory systems ...
Process variations and device aging have a significant impact on the reliability and performance of...
Process variations and device aging have a significant impact on the reliability and performance of ...
Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failu...
Nanoscale circuits are subject to a wide range of new limiting phenomena making essential to investi...
Nanoscale circuits are subject to a wide range of new limiting phenomena making essential to investi...
Scaling of device dimensions toward nano-scale regime has made it essential to innovate novel design...
Scaling of device dimensions toward nano-scale regime has made it essential to innovate novel design...
This work presents a test and measurement technique to monitor aging and process variation status of...
This work presents a test and measurement technique to monitor aging and process variation status of...
Digital computation has penetrated diversity of applications such as audio visual communication, bio...
As technology advances and becomes increasingly smaller in scale, it makes performance and reliabili...
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Gain-cell embedded DRAM (GC-eDRAM) is a dense, low power option for embedded memory implementation, ...
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
The proactive reconfiguration is an emerging technique that enlarges the lifetime of memory systems ...
Process variations and device aging have a significant impact on the reliability and performance of...
Process variations and device aging have a significant impact on the reliability and performance of ...
Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failu...
Nanoscale circuits are subject to a wide range of new limiting phenomena making essential to investi...
Nanoscale circuits are subject to a wide range of new limiting phenomena making essential to investi...
Scaling of device dimensions toward nano-scale regime has made it essential to innovate novel design...
Scaling of device dimensions toward nano-scale regime has made it essential to innovate novel design...
This work presents a test and measurement technique to monitor aging and process variation status of...
This work presents a test and measurement technique to monitor aging and process variation status of...
Digital computation has penetrated diversity of applications such as audio visual communication, bio...
As technology advances and becomes increasingly smaller in scale, it makes performance and reliabili...
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Gain-cell embedded DRAM (GC-eDRAM) is a dense, low power option for embedded memory implementation, ...
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...