The vulnerability of the current and future processors towards transient errors caused by particle strikes is expected to increase rapidly because of exponential growth rate of on-chip transistors, the lower voltages and the shrinking feature size. This encourages innovation in the direction of finding new techniques for providing robustness in logic and memories that allow meeting the desired failures in-time (FIT) budget in future chip multiprocessors (CMPs) present in embedded systems. In embedded systems two aspects of robustness, error detection and containment, are of paramount importance. This paper proposes a light-weight and scalable architecture that uses acoustic wave detectors for error detection and contains errors at the core ...
abstract: Reducing device dimensions, increasing transistor densities, and smaller timing windows, e...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
The vulnerability of the current and future processors towards transient errors caused by particle s...
The trend of downsizing transistors and operating voltage scaling has made the processor chip more s...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
There is broad consensus among academic and industrial researchers in computer architecture that har...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Abstract—Reducing device dimensions, increasing transistor densities, and smaller timing windows, ex...
This thesis deals with algorithms that optimize the implementation of the error detection technique ...
abstract: Reducing device dimensions, increasing transistor densities, and smaller timing windows, e...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
The vulnerability of the current and future processors towards transient errors caused by particle s...
The trend of downsizing transistors and operating voltage scaling has made the processor chip more s...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The continuing decrease in dimensions and operating voltage of transistors has increased their sensi...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The ...
There is broad consensus among academic and industrial researchers in computer architecture that har...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Abstract—Reducing device dimensions, increasing transistor densities, and smaller timing windows, ex...
This thesis deals with algorithms that optimize the implementation of the error detection technique ...
abstract: Reducing device dimensions, increasing transistor densities, and smaller timing windows, e...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...