Effect of high frequency substrate noise on LC-VCOs
- Molina Garcia, Marc Manel
- Aragonès Cervera, Xavier
- Mateo Peña, Diego
- González Jiménez, José Luis
Publication date
January 2010
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
This paper presents an experimental analysis of the performance degradation of an LC-Voltage Controlled Oscillator (LC-VCO) produced by high frequency noise present in the substrate. The spurs observed are shown to be caused by a frequency pulling mechanism. Based on the theory of injection locked oscillators, a new analytical model to predict the behavior of the LC-VCO under the effect of high frequency substrate noise is presented. The analytical model, which is successfully compared with experimental measurements on a 7 GHz LCVCO, provides rapid intuition on the relation between spurs and circuit parameters.Peer Reviewe
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