Add to ORKGThis poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.Peer Reviewe
International audienceIn this summary paper, we discuss two types of sensors that provide a built-in...
This paper introduces a novel on-chip measurement technique for the determination of the central fre...
This letter introduces a novel on-chip measurement technique for the determination of the central fr...
This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measu...
ISBN : 978-1-4673-5542-1International audienceWe present a built-in, defect-oriented test approach f...
In the present paper we analyze that DC temperature measurements of the silicon surface can be used ...
We present a built-in, defect-oriented test approach for RF circuits that is based on thermal monito...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
We present a set of sensors that enable a builtin test in RF circuits. The key characteristic of the...
In the present paper we analyze that DC temperature measurements of the silicon surface can be used...
ISBN 978-3-9810801-8-6International audienceWe present a set of sensors that enable a built- in test...
International audienceIn this summary paper, we discuss two types of sensors that provide a built-in...
This paper introduces a novel on-chip measurement technique for the determination of the central fre...
This letter introduces a novel on-chip measurement technique for the determination of the central fr...
This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measu...
ISBN : 978-1-4673-5542-1International audienceWe present a built-in, defect-oriented test approach f...
In the present paper we analyze that DC temperature measurements of the silicon surface can be used ...
We present a built-in, defect-oriented test approach for RF circuits that is based on thermal monito...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
This paper presents two approaches to characterize RF circuits with built-in differential temperatur...
We present a set of sensors that enable a builtin test in RF circuits. The key characteristic of the...
In the present paper we analyze that DC temperature measurements of the silicon surface can be used...
ISBN 978-3-9810801-8-6International audienceWe present a set of sensors that enable a built- in test...
International audienceIn this summary paper, we discuss two types of sensors that provide a built-in...
This paper introduces a novel on-chip measurement technique for the determination of the central fre...
This letter introduces a novel on-chip measurement technique for the determination of the central fr...