Add to ORKGDelay Fault Testing using scan patterns has been increasingly popular in the DFT world. There’s a debate whether at-speed test with scan patterns can actually replace functional at-speed tests. This paper looks at some of the design considerations for making SoC more delay test friendly and ready. The test chip was designed scan ready but with no delay fault testing constructs
A new on-chip embedding mechanism to improve fault coverage in scan-based de-lay test is proposed. A...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
Delay Fault Testing using scan patterns has been increasingly popular in the DFT world. There’s a ...
Existing approaches for modular manufacturing testing of core-based systems-on-a-chip (SOCs) do not ...
Abstract—Nanometric circuits and systems are increasingly susceptible to delay defects. This paper d...
To meet the market demand, next generation of technology appears with increasing speed and performan...
As manufacturing technology scales down to 65nm and below, fabricated chips are becoming increasingl...
With the growing complexity of today\u27s integrated circuit designs, engineers have abandoned the u...
The economic testing of high-speed digital ICs is becoming increasingly problematic. Even advanced, ...
Problems in testing scannable sequential circuits for delay faults are addressed. Modifications to i...
Devices such as microcontrollers are often required to operate across a wide range of voltage and te...
The semiconductor industry has widely accepted transition delay fault (TDF) and path delay fault (PD...
In current technologies (65nm and beyond), functional failures caused by shorts, opens, and stuck-at...
Abstract — With increasing process fluctuations in nano-scale technology, testing for delay faults i...
A new on-chip embedding mechanism to improve fault coverage in scan-based de-lay test is proposed. A...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
Delay Fault Testing using scan patterns has been increasingly popular in the DFT world. There’s a ...
Existing approaches for modular manufacturing testing of core-based systems-on-a-chip (SOCs) do not ...
Abstract—Nanometric circuits and systems are increasingly susceptible to delay defects. This paper d...
To meet the market demand, next generation of technology appears with increasing speed and performan...
As manufacturing technology scales down to 65nm and below, fabricated chips are becoming increasingl...
With the growing complexity of today\u27s integrated circuit designs, engineers have abandoned the u...
The economic testing of high-speed digital ICs is becoming increasingly problematic. Even advanced, ...
Problems in testing scannable sequential circuits for delay faults are addressed. Modifications to i...
Devices such as microcontrollers are often required to operate across a wide range of voltage and te...
The semiconductor industry has widely accepted transition delay fault (TDF) and path delay fault (PD...
In current technologies (65nm and beyond), functional failures caused by shorts, opens, and stuck-at...
Abstract — With increasing process fluctuations in nano-scale technology, testing for delay faults i...
A new on-chip embedding mechanism to improve fault coverage in scan-based de-lay test is proposed. A...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...