Enable the design of a small contact spring for applications requiring high density, high speed and high durability. A low normal force (LNF) contact spring with high performance is fabricated using a unique combined MEMS photo resist lithography and electro fine forming (EFF) technology. Reducing a total contact material cost of a connector, a high- Hertz stress with LNF contact will be a key technology in the future. Only radius R 5m tip with 0.1N force contact provides an excellent electrical performance which is much sharper than conventional contact. 0.30million cycle’s durability test was passed at 300m displacement and the contact resistance was ≦50mΩ
Microelectromechanical systems (MEMS) switch reliability is a major obstacle for large-volume commer...
MEMS-fabricated electrical contacts are commonly used in MEMS relays. These electrical contacts can...
This paper presents a comparison of Au-Au microcontacts fabricated with planar and engineered lower ...
Enable the design of a small contact spring for applications requiring high density, high speed and...
Enable the design of a small contact spring for applications requiring high density, high speed and ...
Enable the design of a small contact spring for applications requiring high density, high speed and ...
This new technology is realized by Photo Resist Lithography and NiCo Electro Fine Forming Process, a...
Throughout the technological advancements, electronic devices are getting high dense and less expen...
Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LN...
This new technology is realized by Photo Resist Lithography and Ni-Co Electro Fine Forming technolog...
Gradually the electronic devices are getting more compact dimension with respect to the width and th...
The development of a miniature; size, light and high performance electronic devices; has been accel...
This research focused on the development of modified configurations of compliant constant-force mech...
Reliable microelectromechanical systems (MEMS) switches are critical for developing high performance...
This paper presents a comparison of the resistance performance of Au-Au micro-contacts fabricated wi...
Microelectromechanical systems (MEMS) switch reliability is a major obstacle for large-volume commer...
MEMS-fabricated electrical contacts are commonly used in MEMS relays. These electrical contacts can...
This paper presents a comparison of Au-Au microcontacts fabricated with planar and engineered lower ...
Enable the design of a small contact spring for applications requiring high density, high speed and...
Enable the design of a small contact spring for applications requiring high density, high speed and ...
Enable the design of a small contact spring for applications requiring high density, high speed and ...
This new technology is realized by Photo Resist Lithography and NiCo Electro Fine Forming Process, a...
Throughout the technological advancements, electronic devices are getting high dense and less expen...
Reducing a total contact material cost of a connector, a high-Hertz stress with low normal force (LN...
This new technology is realized by Photo Resist Lithography and Ni-Co Electro Fine Forming technolog...
Gradually the electronic devices are getting more compact dimension with respect to the width and th...
The development of a miniature; size, light and high performance electronic devices; has been accel...
This research focused on the development of modified configurations of compliant constant-force mech...
Reliable microelectromechanical systems (MEMS) switches are critical for developing high performance...
This paper presents a comparison of the resistance performance of Au-Au micro-contacts fabricated wi...
Microelectromechanical systems (MEMS) switch reliability is a major obstacle for large-volume commer...
MEMS-fabricated electrical contacts are commonly used in MEMS relays. These electrical contacts can...
This paper presents a comparison of Au-Au microcontacts fabricated with planar and engineered lower ...
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