Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evalua...
New instrumentation has been developed for non-contact, in vacuo measurements of the electron beam-i...
Electrical discharges in accelerating structures are one of the key issues limiting the performance ...
We demonstrate that if charging caused by electron irradiation of an insulator is controlled by a de...
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel...
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel...
Charging and discharging phenomenon on the surface of materials can be found in plasma display pane...
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation pro...
Observation of insulators ' surface in low voltage scanning electron microscope (SEM) becomes u...
Electron microscopes take advantage of a beam of electrons to illuminate aspecimen and extract the n...
The fundamental understanding of vacuum discharge mechanisms and induced surface damage is indispens...
A method is described that allows the trapping charge kinetics in insulating materials during their...
New instrumentation has been developed for in situ measurements of the electron beam- induced surfac...
This paper describes the development of a system capable of monitoring the dynamic movement of surfa...
Making measurements of electron emission properties of insulators is difficult since insulators can ...
Background: Charging of insulators is a complex phenomenon to simulate since the accuracy of the sim...
New instrumentation has been developed for non-contact, in vacuo measurements of the electron beam-i...
Electrical discharges in accelerating structures are one of the key issues limiting the performance ...
We demonstrate that if charging caused by electron irradiation of an insulator is controlled by a de...
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel...
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel...
Charging and discharging phenomenon on the surface of materials can be found in plasma display pane...
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation pro...
Observation of insulators ' surface in low voltage scanning electron microscope (SEM) becomes u...
Electron microscopes take advantage of a beam of electrons to illuminate aspecimen and extract the n...
The fundamental understanding of vacuum discharge mechanisms and induced surface damage is indispens...
A method is described that allows the trapping charge kinetics in insulating materials during their...
New instrumentation has been developed for in situ measurements of the electron beam- induced surfac...
This paper describes the development of a system capable of monitoring the dynamic movement of surfa...
Making measurements of electron emission properties of insulators is difficult since insulators can ...
Background: Charging of insulators is a complex phenomenon to simulate since the accuracy of the sim...
New instrumentation has been developed for non-contact, in vacuo measurements of the electron beam-i...
Electrical discharges in accelerating structures are one of the key issues limiting the performance ...
We demonstrate that if charging caused by electron irradiation of an insulator is controlled by a de...