Presently a major concern about electronic devices operating in space environment is the radiation effects induced by high energetic particles ionizing inside the devices. In order to eliminate these effects, there are two approaches, namely radiation hardened by process and radiation hardened by design. This Final Year Project proposed an efficient and robust design of over-current protection scheme, with high immunity against many radiation effects, such as Single Event Latchup, Single Event Upset and Total Ionizing Dose. The major function of the circuit is to protect power supply and load ICs against Single Event Latchup. A constant transconductance self-biasing circuit is designed to mitigate Total Ionizing Dose effect. A robust radiat...
The purpose of this thesis work is to investigate circuit design techniques to improve the robustnes...
With the progressive scaling of the modern CMOS processes arising during the recent years, for the d...
The mitigation of radiation effects on integrated circuits is discussed in this paper with reference...
Presently a major concern about electronic devices operating in space environment is the radiation e...
Abstract — We present a novel design technique for harden-ing digital electronic circuits against To...
International audienceThe behaviour of Integrated Circuits (IC), in Space, the high atmosphere or ev...
Ionizing radiation, such as high energy electromagnetic radiation and particle radiation, has an ...
Integrated Circuits in space suffer from reliability problems due to the radiative surroundings. Hig...
Radiation from terrestrial and space environments is a great danger to integrated circuits (ICs). A ...
This final year project develops a new Radiation-Hardened-By-Design approach to detect Single Event ...
The ART Series of three output DC-DC converters are designed specifically for use in the hostile rad...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
The design of integrated circuits robust to harsh environments is one of the most challenging issues...
Les travaux de cette thèse sont axés sur le durcissement à la dose cumulée des circuits analogiques ...
The purpose of this thesis work is to investigate circuit design techniques to improve the robustnes...
With the progressive scaling of the modern CMOS processes arising during the recent years, for the d...
The mitigation of radiation effects on integrated circuits is discussed in this paper with reference...
Presently a major concern about electronic devices operating in space environment is the radiation e...
Abstract — We present a novel design technique for harden-ing digital electronic circuits against To...
International audienceThe behaviour of Integrated Circuits (IC), in Space, the high atmosphere or ev...
Ionizing radiation, such as high energy electromagnetic radiation and particle radiation, has an ...
Integrated Circuits in space suffer from reliability problems due to the radiative surroundings. Hig...
Radiation from terrestrial and space environments is a great danger to integrated circuits (ICs). A ...
This final year project develops a new Radiation-Hardened-By-Design approach to detect Single Event ...
The ART Series of three output DC-DC converters are designed specifically for use in the hostile rad...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. ...
The design of integrated circuits robust to harsh environments is one of the most challenging issues...
Les travaux de cette thèse sont axés sur le durcissement à la dose cumulée des circuits analogiques ...
The purpose of this thesis work is to investigate circuit design techniques to improve the robustnes...
With the progressive scaling of the modern CMOS processes arising during the recent years, for the d...
The mitigation of radiation effects on integrated circuits is discussed in this paper with reference...