With advances in silicon microfabrication techniques, electromechanical sensors are shrunk to nanometer scale. Besides enhanced sensitivity, these nanoscaled sensors are found with improved electromechanical and thermoelectric property. Although the future of these devices is promising, the feasibility of having these nano-sensors integrated into commercial devices is unexplored. Here we focus on the mechanical reliability of silicon nanowires (SiNW) and the feastibility of these SiNWs for ultra-sensitive electromechanical sensor. SiNWs are embedded within the anchor of a micro-cantilever and undergo a micro-indentation test, where external cyclic loads are applied through a piezoelectric actuator at the free end of cantilever. This ...
The tensile strength of a silicon nanowire (SiNW) that had been integrated into a silicon-on-insulat...
Fatigue failure knowledge of polycrystalline silicon (polysilicon) thin films is crucial for the des...
Fatigue test results on 15 μm thick polysilicon specimens are presented and compared in this work, b...
With advances in silicon microfabrication techniques, electromechanical sensors are shrunk to nanom...
This final year project report mainly focus on a project that is in conjunction with A*STAR Institut...
Mechanical properties of nanoscale structures are needed to design reliable micro/nanoelectromechani...
Mechanical properties of nanoscale structures are needed to design reliable micro/nanoelectromechani...
Mechanical properties of nanoscale structures are needed to design reliable micro/nanoelectromechani...
This paper presents a MEMS/NEMS device for fatigue and fracture characterization of nanomaterials. T...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
The tensile strength of a silicon nanowire (SiNW) that had been integrated into a silicon-on-insulat...
The tensile strength of a silicon nanowire (SiNW) that had been integrated into a silicon-on-insulat...
Fatigue failure knowledge of polycrystalline silicon (polysilicon) thin films is crucial for the des...
Fatigue test results on 15 μm thick polysilicon specimens are presented and compared in this work, b...
With advances in silicon microfabrication techniques, electromechanical sensors are shrunk to nanom...
This final year project report mainly focus on a project that is in conjunction with A*STAR Institut...
Mechanical properties of nanoscale structures are needed to design reliable micro/nanoelectromechani...
Mechanical properties of nanoscale structures are needed to design reliable micro/nanoelectromechani...
Mechanical properties of nanoscale structures are needed to design reliable micro/nanoelectromechani...
This paper presents a MEMS/NEMS device for fatigue and fracture characterization of nanomaterials. T...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
Fatigue test results on 15 lm thick polysilicon specimens are presented and discussed, both quantita...
The tensile strength of a silicon nanowire (SiNW) that had been integrated into a silicon-on-insulat...
The tensile strength of a silicon nanowire (SiNW) that had been integrated into a silicon-on-insulat...
Fatigue failure knowledge of polycrystalline silicon (polysilicon) thin films is crucial for the des...
Fatigue test results on 15 μm thick polysilicon specimens are presented and compared in this work, b...