Add to ORKGThis project designed AFM probe tips to minimise errors, along with methods of micromachining them.Master of Engineering (MPE
Abstract — Micromanipulation based on AFM (atomic force microscope) has become popular in recent ye...
The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular...
A powerful new class of microscope, the Atomic Force Microscope, has led to a deeper understanding o...
This paper discusses the scanning performance of a trimmed atomic force microscope (AFM) tip. A sta...
The most commonly used materials in all commercially available high-aspect-ratio (HAR) nanowire's (N...
This research is dedicated to develop novel batch fabrication procedures for two distinct AFM (Atomi...
The atomic force microscope (AFM) is a member of the family of scanning probe microscopes, which mak...
Atomic force microscope (AFM) is widely used for topographical structure characterization. However, ...
This thesis describes the design, fabrication, and testing of a metrological atomic force microscope...
This abstract presents the development of an Atomic Force Microscope (AFM) vertical scanner for surf...
The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolu...
The last century was characterized by the extreme developing of the technology, being an essential p...
In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nano...
Advances in the electronics sector, medicine and material sciences have increased the need for inspe...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
Abstract — Micromanipulation based on AFM (atomic force microscope) has become popular in recent ye...
The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular...
A powerful new class of microscope, the Atomic Force Microscope, has led to a deeper understanding o...
This paper discusses the scanning performance of a trimmed atomic force microscope (AFM) tip. A sta...
The most commonly used materials in all commercially available high-aspect-ratio (HAR) nanowire's (N...
This research is dedicated to develop novel batch fabrication procedures for two distinct AFM (Atomi...
The atomic force microscope (AFM) is a member of the family of scanning probe microscopes, which mak...
Atomic force microscope (AFM) is widely used for topographical structure characterization. However, ...
This thesis describes the design, fabrication, and testing of a metrological atomic force microscope...
This abstract presents the development of an Atomic Force Microscope (AFM) vertical scanner for surf...
The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolu...
The last century was characterized by the extreme developing of the technology, being an essential p...
In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nano...
Advances in the electronics sector, medicine and material sciences have increased the need for inspe...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
Abstract — Micromanipulation based on AFM (atomic force microscope) has become popular in recent ye...
The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular...
A powerful new class of microscope, the Atomic Force Microscope, has led to a deeper understanding o...