Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devices in the read ports are preferred for reducing leakage current without sacrificing performance. However, at ultra-low supply voltage levels, higher-Vth devices can retard or nullify energy efficiency due to substantially slower write speed than read. This paper presents energy efficiency maximization techniques for 8T SRAMs utilizing multi-threshold CMOS (MTCMOS) technology and various design techniques. Simulation results using a commercial 65 nm technology show that the SRAM energy efficiency can improved up to 33x through MTCMOS and prior power reduction and performance boosting techniques
This paper involved the design and analysis of multi-threshold voltage CMOS (MTCMOS) current sense a...
This paper presents techniques based on dual oxide thickness assignment to reduce the leakage power ...
Data stability is a primary concern in today's high performance memory circuits with deeply scaled t...
Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devi...
Minimum-energy-driven circuit design is highly required in numerous emerging applications such as mo...
High energy efficient ultra-low voltage SRAMs play a key role in many emerging ultra-low power appli...
This paper presents a 9T multi-threshold (MTCMOS) SRAM macro with equalized bitline leakage and a co...
Abstract — In recent years demand of low power devices is increasing and the reason behind this is ...
The aggressive CMOS technology shrinking driven by cost reduction, performance improvement and power...
International audienceSRAM operation at subthreshold/weak inversion region provides a significant po...
With the development of CMOS technology, the performance including power dissipation and operation s...
Technology advancement has brought about the continuous scaling of transistors sizes.The decreasing ...
SRAM data stability and leakage currents are major concerns in nanometer CMOS technologies. The prim...
option for CMOS ICs. As the supply voltage of low-power ICs decreases, it must remain compatible wit...
The development of memory technology towards more compact and higher storage densities is increasing...
This paper involved the design and analysis of multi-threshold voltage CMOS (MTCMOS) current sense a...
This paper presents techniques based on dual oxide thickness assignment to reduce the leakage power ...
Data stability is a primary concern in today's high performance memory circuits with deeply scaled t...
Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devi...
Minimum-energy-driven circuit design is highly required in numerous emerging applications such as mo...
High energy efficient ultra-low voltage SRAMs play a key role in many emerging ultra-low power appli...
This paper presents a 9T multi-threshold (MTCMOS) SRAM macro with equalized bitline leakage and a co...
Abstract — In recent years demand of low power devices is increasing and the reason behind this is ...
The aggressive CMOS technology shrinking driven by cost reduction, performance improvement and power...
International audienceSRAM operation at subthreshold/weak inversion region provides a significant po...
With the development of CMOS technology, the performance including power dissipation and operation s...
Technology advancement has brought about the continuous scaling of transistors sizes.The decreasing ...
SRAM data stability and leakage currents are major concerns in nanometer CMOS technologies. The prim...
option for CMOS ICs. As the supply voltage of low-power ICs decreases, it must remain compatible wit...
The development of memory technology towards more compact and higher storage densities is increasing...
This paper involved the design and analysis of multi-threshold voltage CMOS (MTCMOS) current sense a...
This paper presents techniques based on dual oxide thickness assignment to reduce the leakage power ...
Data stability is a primary concern in today's high performance memory circuits with deeply scaled t...