Integrated Circuit (IC) technology is getting more advanced and the number of transistors required for an Integrated Circuit (IC) is increases by a factor of 2 every 18 months. Not only that, the size of the transistor is getting smaller, from few micrometers to current tens nanometers, therefore the increment in transistor complexity and decrement in size of transistor and IC increase the probability of voltage glitches occurrence. This will cause errors in the circuitry since the transistor not to behave as per specification due to these frequent voltage glitches occurrence. The impact to the circuitry can be shown by introducing error inserting. This can be done by simulating circuit benchmarks using two differ...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inheren...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have becom...
2011-09-14As VLSI technology node scales to nano-scale, dramatic improvements in most attributes of ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
A reduction in the minimum attainable feature size in integrated circuits h.s lead to the possibilit...
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modificati...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
International audienceVarious methods have been proposed for fault detection and fault tolerance in...
As Moore\u27s Law continues to hold true and transistor density becomes exponentially larger the nee...
Abstract — Traditional methods for testing integrated circuits will reject circuits with a single po...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
When a computational task tolerates a relaxation of its specification or when an algorithm tolerates...
International audienceTo design faster and more energy-efficient systems, numerous inexact arithmeti...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inheren...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have becom...
2011-09-14As VLSI technology node scales to nano-scale, dramatic improvements in most attributes of ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
A reduction in the minimum attainable feature size in integrated circuits h.s lead to the possibilit...
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modificati...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
International audienceVarious methods have been proposed for fault detection and fault tolerance in...
As Moore\u27s Law continues to hold true and transistor density becomes exponentially larger the nee...
Abstract — Traditional methods for testing integrated circuits will reject circuits with a single po...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
When a computational task tolerates a relaxation of its specification or when an algorithm tolerates...
International audienceTo design faster and more energy-efficient systems, numerous inexact arithmeti...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inheren...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have becom...