Grating Scanner for Measurement of Micron-size Beam Profiles

Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affectedby the diameter of a single wire that is of about 4 microns.Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate,resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the rangeof 0.5–1.5 μm for the proposed scanner parameters