Anisotropic defect structure and transport properties of $\mathrm{YBa_2Cu_3O_{7−\delta}}$ films on vicinal $\mathrm{SrTiO_3(001)}$

Brötz, J.
Fuess, H.
Haage, T.
Zegenhagen, J.
Jooss, Ch.
Forkl, A.
Warthmann, R.

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Publication date

January 1999

DOI

10.1063/1.369421

Publisher

AIP Publishing

Abstract

The microstructure of YBa2Cu3O7−δYBa2Cu3O7−δ thin films grown on vicinal SrTiO3(001)SrTiO3(001) has been studied as a function of the vicinal angle by x-ray diffraction using the two-dimensional q-scan technique. Our results reveal a strong correlation between the miscut of a SrTiO3(001)SrTiO3(001) substrate and the anisotropic defect structure of the film. Furthermore, we observed an anisotropy of the corresponding critical current density up to 4.6 depending on the angle of miscut

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Anisotropic defect structure and transport properties of $\mathrm{YBa_2Cu_3O_{7−\delta}}$ films on vicinal $\mathrm{SrTiO_3(001)}$

Abstract

Extracted data

Anisotropic defect structure and transport properties of $\mathrm{YBa_2Cu_3O_{7−\delta}}$ films on vicinal $\mathrm{SrTiO_3(001)}$

Abstract

Extracted data

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