Design of TDS-based Multi-screen Electron Beam Diagnostics for the European XFEL

Dedicated longitudinal electron beam diagnostics is essential for successful operation of modern free-electron lasers. Demand for diagnostic data includes the longitudinal bunch profile, bunch length and slice emittance of the electron bunches. Experimental setups based on transverse deflecting structures (TDS) are excellent candidates for this purpose. At the Free-Electron Laser in Hamburg (FLASH), such a longitudinal bunch profile monitor utilizing a TDS, a fast kicker magnet and an off-axis imaging screen, has been put into operation. It enables the measurement of a single bunch out of a bunch train without affecting the remaining bunches. At the European X-ray Free-Electron Laser (XFEL) multiscreen stations in combination with TDS are planned to be installed. In order to allow for flexible measurements of longitudinal bunch profile and slice emittance, a configurable timing and trigger distribution to the fast kicker magnets and screen stations is required. In this paper, we discuss various operation patterns and the corresponding realization based on MTCA.4 technology