An accurate design is necessary to protect the circuitry of orbiting spacecraft from the effects of a broad band disturbing due to electrostatic discharge (ESD), but this can be achieved when effective simulation tools are available. In this sense, this paper presents a very accurate model for the evaluation of the coupling induced in a transmission line allocated inside a metallic enclosure, representing the metallic shield of an apparatus. The model highlights the effects of the resonant nature of the structure on the intensity and on the duration of the disturbance; theoretical results both in frequency and time domain have been validated by measurements
ESD events can damage or upset electronic vehicle systems, so discharges to the electronic systems o...
This paper presents a time domain approach for the analysis of the coupling between an electrostatic...
An approximate frequency-domain model is developed for field-to-wire coupling in a rectangular metal...
An accurate design is necessary to protect the circuitry of orbiting spacecraft from the effects of ...
This paper presents an accurate analysis of the effects produced by electrostatic discharge (ESD) in...
Electrostatic discharge (ESD) indirect coupling on electronic equipment is theoretically and experim...
The coupling through apertures between an electrostatic discharge (ESD) current flowing on the exter...
The discharge current in the contact mode and the voltage induced inside a shielded cable that inter...
In the first section, a concept for analyzing ESD generators and coupling to EUT (equipment under te...
This work presents an approximate frequency domain mathematical model based on the transmission line...
Currents and voltages injected and induced on high speed high populated printed circuit boards (PCBs...
This paper provides a discussion on the validity of analytical and numerical models for calculating ...
Electromagnetic interference can be easily coupled into metallic shielding enclosure that is penetra...
Interference produced by ESD events in UTP cables is investigated. Typical installation setup of UTP...
The aim of this paper is to investigate conducted and radiated effects produced by a commercial elec...
ESD events can damage or upset electronic vehicle systems, so discharges to the electronic systems o...
This paper presents a time domain approach for the analysis of the coupling between an electrostatic...
An approximate frequency-domain model is developed for field-to-wire coupling in a rectangular metal...
An accurate design is necessary to protect the circuitry of orbiting spacecraft from the effects of ...
This paper presents an accurate analysis of the effects produced by electrostatic discharge (ESD) in...
Electrostatic discharge (ESD) indirect coupling on electronic equipment is theoretically and experim...
The coupling through apertures between an electrostatic discharge (ESD) current flowing on the exter...
The discharge current in the contact mode and the voltage induced inside a shielded cable that inter...
In the first section, a concept for analyzing ESD generators and coupling to EUT (equipment under te...
This work presents an approximate frequency domain mathematical model based on the transmission line...
Currents and voltages injected and induced on high speed high populated printed circuit boards (PCBs...
This paper provides a discussion on the validity of analytical and numerical models for calculating ...
Electromagnetic interference can be easily coupled into metallic shielding enclosure that is penetra...
Interference produced by ESD events in UTP cables is investigated. Typical installation setup of UTP...
The aim of this paper is to investigate conducted and radiated effects produced by a commercial elec...
ESD events can damage or upset electronic vehicle systems, so discharges to the electronic systems o...
This paper presents a time domain approach for the analysis of the coupling between an electrostatic...
An approximate frequency-domain model is developed for field-to-wire coupling in a rectangular metal...
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